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  • DEFSTAN 66-031(PT8)/2(2016) : 2016

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    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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    REQUIREMENTS FOR ELECTRONIC AND ELECTRICAL TEST AND MEASUREMENT EQUIPMENT - PART 8: REQUIREMENTS FOR AUTOMATIC TEST SYSTEMS UTILISING AN OPEN SYSTEM ARCHITECTURE

    Available format(s): 

    Superseded date:  06-03-2023

    Language(s): 

    Published date:  14-11-2016

    Publisher:  UK Ministry of Defence Standards

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    Table of Contents - (Show below) - (Hide below)

    0 Introduction
    1 Scope
    2 Warning
    3 Normative References
    4 Definitions
    5 Abbreviations
    6 Basic Requirements
    7 Open System Architecture Design
    8 Specifying a compliant ATS
    9 TPS Maintainability, Portability and Reuse
    10 Test Program Migration (existing TPS)
    Annex A (informative) - Abbreviations
    Annex B (informative) - Overview of Automatic Test Systems
    Annex C (informative) - Open Standard Architecture Reference Model
    Annex D (informative) - Reference Standards
    Annex E (informative) - Issues for consideration when specifying an ATS

    Abstract - (Show below) - (Hide below)

    Describes the general design, manufacture and supply requirements applicable to Electrical and Electronic Test and Measurement Equipment (TME) intended for Service use, and identifies the responsibilities of procurement authorities and contractors involved in the selection, specification and design activities.

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    Development Note Supersedes DEFSTAN 66-31(PT8)/1(2011). (11/2016)
    Document Type Standard
    Publisher UK Ministry of Defence Standards
    Status Superseded
    Superseded By
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    IEEE 1641.1-2013 IEEE Guide for the Use of IEEE Std 1641, IEEE Standard for Signal and Test Definition
    IEEE 1671.4-2014 IEEE Standard for Automatic Test Markup Language (ATML) Test Configuration
    IEEE 1671.3-2007 IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information
    ARINC 608A : 1993 DESIGN GUIDANCE FOR AVIONICS TEST EQUIPMENT - PART 1: SYSTEM DESCRIPTION
    IEEE 1155 : 1992 VMEBUS EXTENSIONS FOR INSTRUMENTATION: VXIBUS
    IEEE 802-2014 REDLINE IEEE Standard for Local and Metropolitan Area Networks: Overview and Architecture
    IEEE 1671.5-2015 REDLINE IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description
    IEC 60488-2:2004 Standard digital interface for programmable instrumentation - Part 2: Codes, formats, protocols and common commands
    IEEE 1546-2000 IEEE Guide for Digital Test Interchange Format (DTIF) Application
    ARINC 629 : 90 SUPP 5 MULTI TRANSMITTER DATA BUS - TECHNICAL DESCRIPTION
    IEEE 1671.6-2015 REDLINE IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description
    MIL-STD-1760 Revision E:2007 AIRCRAFT/STORE ELECTRICAL INTERCONNECTION SYSTEM
    IEEE 488.1 : 2003 STANDARD FOR HIGHER PERFORMANCE PROTOCOL FOR THE STANDARD DIGITAL INTERFACE FOR PROGRAMMABLE INSTRUMENTATION
    IEEE 1445-1998 IEEE Standard for Digital Test Interchange Format (DTIF)
    ARINC 659 : 1993 BACKPLANE DATA BUS
    IEEE 1149.8.1-2012 IEEE Standard for Boundary-Scan-Based Stimulus of Interconnections to Passive and/or Active Components
    DEFSTAN 00-70(PT1)/2(2013) : 2013 STANDARD SERVICEABILITY TESTING - PART 1: THE PROCESS FOR THE PREPARATION OF AND REQUIREMENTS AND GUIDANCE FOR, A STANDARD SERVICEABILITY TEST SPECIFICATION
    ISO 11898-2:2016 Road vehicles — Controller area network (CAN) — Part 2: High-speed medium access unit
    IEEE 488.2 : 1992 STANDARD CODES, FORMATS, PROTOCOLS, AND COMMON COMMANDS FOR USE WITH IEEE 488.1-1987, IEEE STANDARD DIGITAL INTERFACE FOR PROGRAMMABLE INSTRUMENTATION
    STANAG 3838 : 2016 DIGITAL TIME DIVISION COMMAND/RESPONSE MULTIPLEX DATA BUS
    IEEE 1505.1-2008 IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
    IEEE 1671.2-2012 IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description
    ISO 11898-1:2015 Road vehicles — Controller area network (CAN) — Part 1: Data link layer and physical signalling
    STANAG 3910 : 0 HIGH SPEED DATA TRANSMISSION UNDER STANAG 3838 AVS OR FIBRE OPTIC EQUIVALENT CONTROL
    DEFSTAN 00-42(PT4)/3(2014) : 2014 RELIABILITY AND MAINTAINABILITY ACTIVITY - PART 4: TESTABILITY
    IEEE 1636-2009 IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA)
    ISO 11898-4:2004 Road vehicles — Controller area network (CAN) — Part 4: Time-triggered communication
    ISO 11898-3:2006 Road vehicles Controller area network (CAN) Part 3: Low-speed, fault-tolerant, medium-dependent interface
    IEEE 1636.1-2013 IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Language (XML)
    IEEE 1149.6-2003 IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks
    IEC 60488-1:2004 Higher performance protocol for the standard digital interface for programmable instrumentation - Part 1: General
    ARINC 429 : 2001 ELECTRONIC DISKETTE COPY OF DATA LABELS IN MICROSOFT WORD AND EXCEL FORMATS
    IEEE 1588-2008 REDLINE IEEE Standard for a Precision Clock Synchronization Protocol for Networked Measurement and Control Systems
    IEEE 1671.1-2009 IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions
    IEEE 1149.1-2013 REDLINE IEEE Standard for Test Access Port and Boundary-Scan Architecture
    MIL-STD-1553 Revision B:1978 DIGITAL TIME DIVISION COMMAND/RESPONSE MULTIPLEX DATA
    ISO 11898-5:2007 Road vehicles Controller area network (CAN) Part 5: High-speed medium access unit with low-power mode
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