IEEE 1445-1998
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
IEEE Standard for Digital Test Interchange Format (DTIF)
19-10-2021
English
10-03-1999
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1. Overview
2. Normative references
3. Definitions, acronyms and abbreviations
4. Data organization overview of the DTIF
standard environment
5. File type specifications
6. Conformance
Annex A (informative) - IEEE download website
material associated with this document
Annex B (informative) - Example of a circuit used in
a test simulation
Annex C (informative) - Bibliography
Specifies DATPG output data formats and informational content for UUT models, stimulus and response patterns, fault dictionaries, and diagnostic probing.
| Committee |
SCC20 - Test and Diagnosis for Electronic Sys
|
| DevelopmentNote |
Supersedes IEEE DRAFT 1445. (11/1999)
|
| DocumentType |
Standard
|
| Pages |
108
|
| PublisherName |
Institute of Electrical & Electronics Engineers
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| DEFSTAN 66-031(PT8)/2(2016) : 2016 | REQUIREMENTS FOR ELECTRONIC AND ELECTRICAL TEST AND MEASUREMENT EQUIPMENT - PART 8: REQUIREMENTS FOR AUTOMATIC TEST SYSTEMS UTILISING AN OPEN SYSTEM ARCHITECTURE |
| DEFSTAN 00-52/4(2014) : 2014 | THE GENERAL REQUIREMENTS FOR PRODUCT ACCEPTANCE AND MAINTENANCE TEST SPECIFICATIONS AND TEST SCHEDULES |
| BS IEC 61671:2012 | IEEE standard for automatic test markup language (ATML) for exchanging automatic test equipment and test information via XML |
| BS IEC 62529:2012 | IEEE standard for signal and test definition |
| IEC 61671:2012 | Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML |
| IEEE DRAFT 1546 : D3.0 2000 | DRAFT GUIDE FOR DIGITAL TEST INTERCHANGE FORMAT (DTIF) APPLICATION |
| IEEE 1671.1-2009 | IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions |
| IEC 62529:2012 | Standard for Signal and Test Definition |
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