IEEE 1671.1-2009
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions
11-12-2013
English
11-12-2009
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1. Overview
2. Normative references
3. Definitions, acronyms, and abbreviations
4. Test Description schema
5. Describing test program structure
6. Describing control flow
7. Describing data
8. Describing test behavior
9. Describing fault isolation
10. ATML Test Description XML schema names and
locations
11. ATML XML schema extensibility
12. Conformance
Annex A (normative) - XML schemas
Annex B (informative) - TSF library examples
Annex C (informative) - Describing digital testing
Annex D (informative) - Describing serial digital bus exchanges
Annex E (informative) - IEEE download web-site material
associated with this document
Annex F (informative) - Users information and examples
Annex G (informative) - Glossary
Annex H (informative) - Bibliography
The scope of this trial-use standard is the definition of an exchange format, utilizing eXtensible Markup Language (XML), for exchanging the test description information defining test performance, test conditions, diagnostic requirements, and support equipment to locate, align, and verify the proper operation of a UUT.
| Committee |
SCC20 - Test and Diagnosis for Electronic Sys
|
| DocumentType |
Standard
|
| ISBN |
978-0-7381-6066-5
|
| Pages |
195
|
| PublisherName |
Institute of Electrical & Electronics Engineers
|
| Status |
Superseded
|
| SupersededBy |
| DEFSTAN 66-031(PT8)/2(2016) : 2016 | REQUIREMENTS FOR ELECTRONIC AND ELECTRICAL TEST AND MEASUREMENT EQUIPMENT - PART 8: REQUIREMENTS FOR AUTOMATIC TEST SYSTEMS UTILISING AN OPEN SYSTEM ARCHITECTURE |
| DEFSTAN 00-52/4(2014) : 2014 | THE GENERAL REQUIREMENTS FOR PRODUCT ACCEPTANCE AND MAINTENANCE TEST SPECIFICATIONS AND TEST SCHEDULES |
| IEEE 1636.1-2013 | IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Language (XML) |
| IEC 61636-99:2016 | Software Interface for Maintenance Information Collection and Analysis (SIMICA): Common Information Elements |
| IEEE 1671.3-2007 | IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information |
| IEEE 1636.99-2013 | IEEE Std 1636.99-2013, IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Common Information Elements. |
| BS IEC 61671:2012 | IEEE standard for automatic test markup language (ATML) for exchanging automatic test equipment and test information via XML |
| BS IEC 61636:2016 | Software Interface for Maintenance Information Collection and Analysis (SIMICA) |
| BS IEC 61636-1:2016 | Software interface for maintenance information collection and analysis (SIMICA): Exchanging test results and session information via the extensible markup language (XML) |
| IEC 61671:2012 | Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML |
| IEC 61636-1:2016 | Software interface for maintenance information collection and analysis (SIMICA): Exchanging test results and session information via the extensible markup language (XML) |
| BS IEC 61636-99:2016 | Software Interface for Maintenance Information Collection and Analysis (SIMICA): Common Information Elements |
| IEC 61636:2016 | Software interface for Maintenance Information Collection and Analysis (SIMICA) |
| IEEE 1641.1-2013 | IEEE Guide for the Use of IEEE Std 1641, IEEE Standard for Signal and Test Definition |
| IEEE 1671.3-2007 | IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information |
| IEEE 1671.5-2015 | IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description |
| IEEE 260.1 : 2004 | LETTER SYMBOLS FOR UNITS OF MEASUREMENT (SI UNITS, CUSTOMARY INCH-POUND UNITS, AND CERTAIN OTHER UNITS) |
| IEEE 488.1 : 2003 | STANDARD FOR HIGHER PERFORMANCE PROTOCOL FOR THE STANDARD DIGITAL INTERFACE FOR PROGRAMMABLE INSTRUMENTATION |
| IEEE 1445-1998 | IEEE Standard for Digital Test Interchange Format (DTIF) |
| MIL-HDBK-1553 Revision A:1988 | Multiplex Application Handbook |
| IEEE 488.2 : 1992 | STANDARD CODES, FORMATS, PROTOCOLS, AND COMMON COMMANDS FOR USE WITH IEEE 488.1-1987, IEEE STANDARD DIGITAL INTERFACE FOR PROGRAMMABLE INSTRUMENTATION |
| MIL-STD-1345 Revision B:1981 | TEST REQUIREMENT DOCUMENT PREPARATION OF |
| IEEE 1641-2004 | IEEE Standard for Signal and Test Definition |
| IEEE 1636.1-2013 | IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Language (XML) |
| IEEE 1671-2006 | IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML |
| MIL-STD-1519 Base Document:1971 | TEST REQUIREMENTS DOCUMENT, PREPARATION OF |
| IEEE 754-2008 REDLINE | IEEE Standard for Floating-Point Arithmetic |
| MIL-STD-1553 Revision B:1978 | DIGITAL TIME DIVISION COMMAND/RESPONSE MULTIPLEX DATA |
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