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  • IEEE 1671.2-2012

    Withdrawn A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

    IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description

    Available format(s):  PDF, Hardcopy

    Withdrawn date:  30-03-2023

    Language(s):  English

    Published date:  15-02-2013

    Publisher:  Institute of Electrical & Electronics Engineers

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    Table of Contents - (Show below) - (Hide below)

    1 Overview
    2 Normative references
    3 Definitions, abbreviations, and acronyms
    4 InstrumentDescription schema
    5 InstrumentDescription instance schema
    6 ATML InstrumentDescription XML schema names and locations
    7 ATML XML schema extensibility
    8 Conformance
    Annex A (informative) - IEEE download Web site material
                            associated with this document
    Annex B (informative) - Users information and examples
    Annex C (informative) - Glossary
    Annex D (informative) - Bibliography

    Abstract - (Show below) - (Hide below)

    This standard defines an exchange format, utilizing extensible markup language (XML), for both the static description of instrument models, and the specific description of instrument instance information.

    General Product Information - (Show below) - (Hide below)

    Committee SCC20 - Test and Diagnosis for Electronic Sys
    Development Note Also numbered as IEC 61671-2. (04/2016)
    Document Type Standard
    Publisher Institute of Electrical & Electronics Engineers
    Status Withdrawn
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    DEFSTAN 66-031(PT8)/2(2016) : 2016 REQUIREMENTS FOR ELECTRONIC AND ELECTRICAL TEST AND MEASUREMENT EQUIPMENT - PART 8: REQUIREMENTS FOR AUTOMATIC TEST SYSTEMS UTILISING AN OPEN SYSTEM ARCHITECTURE
    DEFSTAN 00-52/4(2014) : 2014 THE GENERAL REQUIREMENTS FOR PRODUCT ACCEPTANCE AND MAINTENANCE TEST SPECIFICATIONS AND TEST SCHEDULES
    IEC 61671:2012 Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
    BS IEC 61671:2012 IEEE standard for automatic test markup language (ATML) for exchanging automatic test equipment and test information via XML
    IEEE 1871.1-2014 IEEE Recommended Practice for Using IEEE 1671.2(TM) Instrument Description Templates for Describing Synthetic Instrumentation for Classes of Instruments such as Waveform Generators, Digitizers, External Oscillators, and Up and Down Converters
    IEEE 1641.1-2013 IEEE Guide for the Use of IEEE Std 1641, IEEE Standard for Signal and Test Definition

    Standards Referencing This Book - (Show below) - (Hide below)

    IEEE 1057-2007 REDLINE IEEE Standard for Digitizing Waveform Recorders
    IEEE 1155 : 1992 VMEBUS EXTENSIONS FOR INSTRUMENTATION: VXIBUS
    TIA 232 : F1997(R2012) INTERFACE BETWEEN DATA TERMINAL EQUIPMENT AND DATA CIRCUIT-TERMINATING EQUIPMENT EMPLOYING SERIAL BINARY DATA INTERCHANGE
    IEC 60488-2:2004 Standard digital interface for programmable instrumentation - Part 2: Codes, formats, protocols and common commands
    IEEE 802.3-2012 IEEE Standard for Ethernet
    IEEE 1671.6-2015 REDLINE IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description
    IEEE 260.1 : 2004 LETTER SYMBOLS FOR UNITS OF MEASUREMENT (SI UNITS, CUSTOMARY INCH-POUND UNITS, AND CERTAIN OTHER UNITS)
    IEEE 1671-2010 IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
    MIL-PRF-55310 Revision E:2006 OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR
    MIL-STD-1309 Revision D:1992 DEFINITIONS OF TERMS FOR TEST, MEASUREMENT AND DIAGNOSTIC EQUIPMENT
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