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IEEE 1671-2006

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML

Available format(s)

PDF

Superseded date

19-10-2021

Superseded by

IEEE 1671-2010

Language(s)

English

Published date

15-12-2006

€106.60
Excluding VAT

Committee
SCC20 - Test and Diagnosis for Electronic Sys
DocumentType
Standard
Pages
89
PublisherName
Institute of Electrical & Electronics Engineers
Status
Superseded
SupersededBy

IEEE 1636.2-2010 IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Maintenance Action Information via the Extensible Markup Language (XML)
IEEE 1636.1-2007 IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Language(XML)
IEEE 1671.1-2009 IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions
IEEE 1671.5-2008 IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information
IEEE 1671.4-2007 IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Information
IEEE 1671.6-2008 IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Station Information
IEEE 1671.2-2008 IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions
IEEE 1671.3-2007 IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information

IEEE 1232-2002 IEEE Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI- ESTATE)
IEEE 1522-2004 IEEE Standard for Testability and Diagnosability Characteristics and Metrics
IEEE 1641-2004 IEEE Standard for Signal and Test Definition

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