Name: IEEE 1671-2006
Brand: IEEE
Price: 110.84 EUR
Availability: InStock

IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML

Available format(s)

PDF

Superseded date

19-10-2021

Language(s)

English

Published date

15-12-2006

Publisher

Institute of Electrical & Electronics Engineers

Committee	SCC20 - Test and Diagnosis for Electronic Sys
DocumentType	Standard
Pages	89
PublisherName	Institute of Electrical & Electronics Engineers
Status	Superseded
SupersededBy	IEEE 1671-2010

IEEE 1636.2-2010	IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Maintenance Action Information via the Extensible Markup Language (XML)
IEEE 1636.1-2007	IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Language(XML)
IEEE 1671.1-2009	IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions
IEEE 1671.5-2008	IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information
IEEE 1671.4-2007	IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Information
IEEE 1671.6-2008	IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Station Information
IEEE 1671.2-2008	IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions
IEEE 1671.3-2007	IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information

IEEE 1232-2002	IEEE Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI- ESTATE)
IEEE 1522-2004	IEEE Standard for Testability and Diagnosability Characteristics and Metrics
IEEE 1641-2004	IEEE Standard for Signal and Test Definition

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IEEE 1671-2006