IEEE 1671-2010
Withdrawn
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
View Superseded by
IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
Available format(s)
PDF
Withdrawn date
25-03-2021
Superseded by
Language(s)
English
Published date
20-01-2011
Important note : Users cannot be edited or removed once added to your Multi user PDF.| Committee |
SCC20 - Test and Diagnosis for Electronic Sys
|
| DocumentType |
Standard
|
| Pages |
388
|
| PublisherName |
Institute of Electrical & Electronics Engineers
|
| Status |
Withdrawn
|
| SupersededBy | |
| Supersedes |
| IEEE/IEC 61671-5-2016 | IEC/IEEE International Standard - Automatic Test Markup Language (ATML) Test Adapter Description |
| IEEE 1671.5-2015 | IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description |
| IEEE 1671.2-2012 | IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description |
| IEEE 1871.2-2017 | IEEE Recommended Practice for IEEE 1671 Test Equipment Templates and Extension Classes for Describing Intrinsic Signal Path Information for Cables, Interface Adapters, and Test Equipment |
| IEEE 1671.6-2015 | IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description |
| IEEE 1871.1-2014 | IEEE Recommended Practice for Using IEEE 1671.2(TM) Instrument Description Templates for Describing Synthetic Instrumentation for Classes of Instruments such as Waveform Generators, Digitizers, External Oscillators, and Up and Down Converters |
| IEEE 1671.4-2014 | IEEE Standard for Automatic Test Markup Language (ATML) Test Configuration |
| IEEE 1636.1-2013 | IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Language (XML) |
| IEEE/IEC 61671-2-2016 | IEC/IEEE International Standard for Automatic Test Markup Language (ATML) Instrument Description |
| IEEE 1636.99-2013 | IEEE Std 1636.99-2013, IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Common Information Elements. |
| IEEE/IEC 61671-6-2016 | IEC/IEEE International Standard - Standard for Automatic Test Markup Language (ATML) Test Station Description |
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