ISO 11775:2015
Current
Current
The latest, up-to-date edition.
Surface chemical analysis — Scanning-probe microscopy — Determination of cantilever normal spring constants
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
15-10-2015
€130.00
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ISO 11775:2015 describes five of the methods for the determination of normal spring constants for atomic force microscope cantilevers to an accuracy of 5 % to 10 %. Each method is in one of the three categories of dimensional, static experimental, and dynamic experimental methods. The method chosen depends on the purpose, convenience, and instrumentation available to the analyst. For accuracies better than 5 % to 10 %, more sophisticated methods not described here are required.
| Committee |
ISO/TC 201/SC 9
|
| DevelopmentNote |
Supersedes ISO/DIS 11775. (10/2015)
|
| DocumentType |
Standard
|
| Pages |
24
|
| PublisherName |
International Organization for Standardization
|
| Status |
Current
|
| Standards | Relationship |
| BS ISO 11775:2015 | Identical |
| JIS K 0182:2023 | Identical |
| 11/30199166 DC : 0 | BS ISO 11952 - SURFACE CHEMICAL ANALYSIS - SCANNING PROBE MICROSCOPY - DETERMINATION OF GEOMETRIC QUANTITIES USING SPM - CALIBRATION OF MEASURING SYSTEMS |
| 16/30300288 DC : 0 | BS ISO 19606 - FINE CERAMICS (ADVANCED CERAMICS, ADVANCED TECHNICAL CERAMICS) - TEST METHOD FOR SURFACE ROUGHNESS OF FINE CERAMIC FILMS BY ATOMIC FORCE MICROSCOPY |
| BS ISO 19606:2017 | Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for surface roughness of fine ceramic films by atomic force microscopy |
| ISO 19606:2017 | Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for surface roughness of fine ceramic films by atomic force microscopy |
| ISO 18115-2:2013 | Surface chemical analysis — Vocabulary — Part 2: Terms used in scanning-probe microscopy |
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