ISO 13695:2004
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
Optics and photonics — Lasers and laser-related equipment — Test methods for the spectral characteristics of lasers
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
22-11-2024
English, French
07-06-2004
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ISO 13695:2004 specifies methods by which the spectral characteristics such as wavelength, bandwidth, spectral distribution and wavelength stability of a laser beam can be measured. ISO 13695:2004 is applicable to both continuous wave (cw) and pulsed laser beams. The dependence of the spectral characteristics of a laser on its operating conditions may also be important.
| Committee |
ISO/TC 172/SC 9
|
| DevelopmentNote |
Supersedes ISO/DIS 13695 (06/2004)
|
| DocumentType |
Standard
|
| Pages |
25
|
| PublisherName |
International Organization for Standardization
|
| Status |
Withdrawn
|
| UnderRevision |
| Standards | Relationship |
| GOST R ISO 13695 : 2010 | Identical |
| NF EN ISO 13695 : 2005 | Identical |
| NBN EN ISO 13695 : 2004 | Identical |
| NEN EN ISO 13695 : 2004 | Identical |
| NS EN ISO 13695 : 1ED 2004 | Identical |
| I.S. EN ISO 13695:2004 | Identical |
| PN EN ISO 13695 : 2007 | Identical |
| SN EN ISO 13695 : 2005 | Identical |
| UNI EN ISO 13695 : 2004 | Identical |
| BS EN ISO 13695:2004 | Identical |
| UNE-EN ISO 13695:2006 | Identical |
| EN ISO 13695:2004 | Identical |
| DIN EN ISO 13695:2004-09 | Identical |
| 02/211632 DC : DRAFT DEC 2002 | IEC 69747-5-4 ED.1 - SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 5-4: OPTOELECTRONIC DEVICES - SEMICONDUCTOR LASERS |
| ISO/TS 17915:2013 | Optics and photonics Measurement method of semiconductor lasers for sensing |
| UNE-EN ISO 11252:2013 | Lasers and laser-related equipment - Laser device - Minimum requirements for documentation (ISO 11252:2013) |
| I.S. EN ISO 11252:2013 | LASERS AND LASER-RELATED EQUIPMENT - LASER DEVICE - MINIMUM REQUIREMENTS FOR DOCUMENTATION (ISO 11252:2013) |
| PD ISO/TS 17915:2013 | Optics and photonics. Measurement method of semiconductor lasers for sensing |
| IEC 60747-5-4:2006 | Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers |
| IEC 60601-2-75:2017 | Medical electrical equipment - Part 2-75: Particular requirements for the basic safety and essential performance of photodynamic therapy and photodynamic diagnosis equipment |
| UNI EN ISO 11252 : 2013 | LASERS AND LASER-RELATED EQUIPMENT - LASER DEVICE - MINIMUM REQUIREMENTS FOR DOCUMENTATION |
| ISO 11252:2013 | Lasers and laser-related equipment — Laser device — Minimum requirements for documentation |
| BS EN ISO 11252:2013 | Lasers and laser-related equipment. Laser device. Minimum requirements for documentation |
| BS IEC 60747-5-4:2006 | Semiconductor devices. Discrete devices Optoelectronic devices. Semiconductor lasers |
| DIN EN ISO 11252:2014-02 | LASERS AND LASER-RELATED EQUIPMENT - LASER DEVICE - MINIMUM REQUIREMENTS FOR DOCUMENTATION (ISO 11252:2013) |
| EN ISO 11252:2013 | Lasers and laser-related equipment - Laser device - Minimum requirements for documentation (ISO 11252:2013) |
| IEC 60747-5-1:1997+AMD1:2001+AMD2:2002 CSV | Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General |
| ISO 12005:2003 | Lasers and laser-related equipment Test methods for laser beam parameters Polarization |
| ISO 11145:2016 | Optics and photonics Lasers and laser-related equipment Vocabulary and symbols |
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