ISO 15932:2013
Current
Current
The latest, up-to-date edition.
Microbeam analysis — Analytical electron microscopy — Vocabulary
Available format(s)
Hardcopy , PDF
Language(s)
English, French
Published date
13-12-2013
€130.00
Excluding VAT
ISO 15932:2013 defines terms used in the practice of AEM. It covers both general and specific concepts classified according to their hierarchy in a systematic order. It is applicable to all standardization documents relevant to the practice of AEM. In addition, some parts of this International Standard are applicable to those documents relevant to the practice of related fields (e.g. TEM, STEM, SEM, EPMA, EDX) for the definition of those terms common to them.
| Committee |
ISO/TC 202/SC 1
|
| DevelopmentNote |
Supersedes ISO/DIS 15932. (12/2013)
|
| DocumentType |
Standard
|
| Pages |
21
|
| PublisherName |
International Organization for Standardization
|
| Status |
Current
|
| Standards | Relationship |
| BS ISO 15932:2013 | Identical |
| NF ISO 15932 : 2014 | Identical |
| BS ISO 25498:2010 | Microbeam analysis. Analytical electron microscopy. Selected-area electron diffraction analysis using a transmission electron microscope |
| ISO 20263:2017 | Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials |
| 17/30343628 DC : 0 | BS ISO 25498 - MICROBEAM ANALYSIS - ANALYTICAL ELECTRON MICROSCOPY - SELECTED-AREA ELECTRON DIFFRACTION ANALYSIS USING A TRANSMISSION ELECTRON MICROSCOPE |
| 16/30319120 DC : 0 | BS ISO 20263 - MICROBEAM ANALYSIS - ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY - DETERMINATION METHOD FOR INTERFACE POSITION IN THE CROSS-SECTIONAL IMAGE OF THE LAYERED MATERIALS |
| BS ISO 20263:2017 | Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials |
| ISO 25498:2018 | Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope |
| ISO 1087-1:2000 | Terminology work — Vocabulary — Part 1: Theory and application |
| ISO 22493:2014 | Microbeam analysis — Scanning electron microscopy — Vocabulary |
| ISO 23833:2013 | Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary |
| ISO 704:2009 | Terminology work — Principles and methods |
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