ISO 17526:2003
Current
The latest, up-to-date edition.
Optics and optical instruments Lasers and laser-related equipment Lifetime of lasers
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English, French
20-06-2003
ISO 17526:2003 covers terms and definitions as well as test methods and evaluation procedures to characterize, estimate and predict the longterm behaviour of various types of lasers.
It defines terms for the lifetime of lasers and specifies test procedures and fundamental aspects for the determination of lifetime. It applies for all types of lasers for which lifetime is a critical issue, including diode lasers except those used in telecommunications.
DevelopmentNote |
Supersedes ISO/DIS 17526 (06/2003)
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DocumentType |
Standard
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Pages |
12
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PublisherName |
International Organization for Standardization
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Status |
Current
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Standards | Relationship |
NBN EN ISO 17526 : 2003 | Identical |
NEN EN ISO 17526 : 2003 | Identical |
NS EN ISO 17526 : 1ED 2003 | Identical |
I.S. EN ISO 17526:2003 | Identical |
PN EN ISO 17526 : 2006 | Identical |
UNE-EN ISO 17526:2004 | Identical |
SN EN ISO 17526 : 2003 | Identical |
UNI EN ISO 17526 : 2003 | Identical |
BS EN ISO 17526:2003 | Identical |
EN ISO 17526:2003 | Identical |
DIN EN ISO 17526:2003-10 | Identical |
NF EN ISO 17526 : 2003 | Identical |
02/211632 DC : DRAFT DEC 2002 | IEC 69747-5-4 ED.1 - SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 5-4: OPTOELECTRONIC DEVICES - SEMICONDUCTOR LASERS |
UNE-EN ISO 11252:2013 | Lasers and laser-related equipment - Laser device - Minimum requirements for documentation (ISO 11252:2013) |
03/314745 DC : DRAFT SEP 2003 | ISO 11252 - LASERS AND LASER-RELATED EQUIPMENT - LASER DEVICE - MINIMUM REQUIREMENTS FOR DOCUMENTATION |
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ISO 11252:2013 | Lasers and laser-related equipment — Laser device — Minimum requirements for documentation |
BS EN ISO 11252:2013 | Lasers and laser-related equipment. Laser device. Minimum requirements for documentation |
BS IEC 60747-5-4:2006 | Semiconductor devices. Discrete devices Optoelectronic devices. Semiconductor lasers |
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ISO 11252:2013 | Lasers and laser-related equipment — Laser device — Minimum requirements for documentation |
IEC 60319:1999 | Presentation and specification of reliability data for electronic components |
ISO 16269-7:2001 | Statistical interpretation of data — Part 7: Median — Estimation and confidence intervals |
ISO 2859:1974 | Sampling procedures and tables for inspection by attributes |
EN ISO 11554:2017 | Optics and photonics - Lasers and laser-related equipment - Test methods for laser beam power, energy and temporal characteristics (ISO 11554:2017) |
IEC 60410:1973 | Sampling plans and procedures for inspection by attributes |
IEC 61703:2016 | Mathematical expressions for reliability, availability, maintainability and maintenance support terms |
EN ISO 11145:2016 | Optics and photonics - Lasers and laser-related equipment - Vocabulary and symbols (ISO 11145:2016) |
ISO 11145:2016 | Optics and photonics Lasers and laser-related equipment Vocabulary and symbols |
IEC 61751:1998 | Laser modules used for telecommunication - Reliability assessment |
IEC 61040:1990 | Power and energy measuring detectors, instruments and equipment for laser radiation |
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