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JEDEC JESD 22-B113B:2018

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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Board Level Cyclic Bend Test Method for Interconnect Reliability Characterization of SMT ICs for Handheld Electronic Products

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-08-2018

Superseded date

24-12-2025

Superseded by

JEDEC JESD22-B113C:2025

Free

The Board Level Cyclic Bend Test Method is intended to evaluate and compare the performance of SMT ICs in an accelerated test environment for handheld electronic products applications.

Committee
JC-14.1
DocumentType
Test Method
Pages
26
PublisherName
JEDEC Solid State Technology Association
Status
Superseded
SupersededBy
Supersedes

IPC JEDEC-9704A:2012 Printed Circuit Assembly Strain Gage Test Guideline
IPC-9701B:2022 Thermal Cycling Test Method for Fatigue Life Characterization of Surface Mount Attachments

Free