JIS C 5402-1-1:2005
Current
The latest, up-to-date edition.
Connectors for electronic equipment --Tests and measurements-- Part 1-1: General examination -- Test 1a: Visual examination
Hardcopy , PDF
Japanese, English
20-03-2005
Important note : Users cannot be edited or removed once added to your Multi user PDF.
This section of JIS C 5402-1 is to define a standard test method for the visual examination of electromechanical components.
| DocumentType |
Test Method
|
| Pages |
0
|
| PublisherName |
Japanese Standards Association
|
| Status |
Current
|
| Standards | Relationship |
| IEC 60512-1-1:2002 | Identical |
Reaffirmed 2014 2005(R2014) [20/10/2014]2005(R2009) [01/10/2009]2005 [20/03/2005]
| JIS C 5402-5-1:2005 | Connectors for electronic equipment - Tests and measurements Part 5-1: Current-carrying capacity tests - Test 5a: Temperature rise |
| JIS C 5402-11-3:2005 | Connectors for electronic equipment - Tests and measurements Part 11-3: Climatic tests - Test 11c: Damp heat, steady state |
| JIS C 5402-6-2:2005 | Connectors for electronic equipment -- Tests and measurements Part 6-2: Dynamic stress tests - Test 6b: Bump |
| JIS C 5402-11-6:2005 | Connectors for electronic equipment - Tests and measurements Part 11-6: Climatic tests - Test 11f: Corrosion, salt mist |
| JIS C 5402-11-4:2005 | Connectors for electronic equipment -- Tests and measurements -- Part 11-4: Climatic tests -- Test 11d: Rapid change of temperature Part 11-4: Climatic tests - Test 11d: Rapid change of temperature |
| JIS C 5402-11-7:2006 | Connectors for electronic equipment -- Tests and measurements -- Part 11-7: Climatic tests -- Test 11g: Flowing mixed gas corrosion test |
| JIS C 5402-11-10:2005 | Connectors for electronic equipment - Tests and measurements Part 11-10: Climatic tests - Test 11j: Cold |
| JIS C 5402-10-4:2006 | Connectors For Electronic Equipment - Tests And Measurements - Part 10-4: Impact Tests (free Components), Static Load Tests (fixed Components), Endurance Tests And Overload Tests - Test 10d: Electrical Overload (connectors) |
| JIS C 5402-6-1:2005 | Connectors for electronic equipment - Tests and measurements Part 6-1: Dynamic stress tests - Test 6a: Acceleration, steady state |
| JIS C 5402-11-11:2005 | Connectors for electronic equipment - Tests and measurements Part 11-11: Climatic tests - Test 11k: Low air pressure |
| JIS C 5402-11-5:2005 | Connectors for electronic equipment -- Tests and measurements -- Part 11-5: Climatic tests -- Test 11e: Mould growth Part 11-5: Climatic tests - Test 11e: Mould growth |
| JIS C 5402-6-3:2005 | Connectors for electronic equipment -- Tests and measurements -- Part 6-3: Dynamic stress tests -- Test 6c: Shock Part 6-3: Dynamic stress tests - Test 6c: Shock |
| JIS C 5402-11-12:2005 | Connectors for electronic equipment - Tests and measurements Part 11-12: Climatic tests - Test 11m: Damp heat, cyclic |
| JIS C 5402-11-13:2005 | Connectors for electronic equipment -- Tests and measurements -- Part 11-13: Climatic tests -- Test 11n: Gas tightness, solderless wrapped connections<br> |
| JIS C 5402-11-14:2006 | Connectors for electronic equipment - Tests and measurements Part 11-14: Climatic tests - Test 11p: Flowing single gas corrosion test |
| JIS C 5402-6-4:2005 | Connectors for electronic equipment -- Tests and measurements -- Part 6-4: Dynamic stress tests -- Test 6d: Vibration (sinusoidal) |
| JIS C 5402-11-9:2005 | Connectors for electronic equipment -- Tests and measurements -- Part 11-9: Climatic tests -- Test 11i: Dry heat Part 11-9: Climatic tests - Test 11i: Dry heat |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.