JIS C 5402-11-5:2005
Current
The latest, up-to-date edition.
Connectors for electronic equipment -- Tests and measurements -- Part 11-5: Climatic tests -- Test 11e: Mould growth Part 11-5: Climatic tests - Test 11e: Mould growth
Hardcopy , PDF
English, Japanese
20-03-2005
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This section of JIS C 5402-11 is to define a standard test method to assess the extent and the effect of mould growth on the functioning of a component submitted to a mould culture.
| DocumentType |
Standard
|
| Pages |
2
|
| PublisherName |
Japanese Standards Association
|
| Status |
Current
|
| Standards | Relationship |
| IEC 60512-11-5:2002 | Identical |
Reaffirmed 2014 2005(R2014) [20/10/2014]2005(R2009) [01/10/2009]2005 [20/03/2005]
| JIS C 5402-1-1:2005 | Connectors for electronic equipment --Tests and measurements-- Part 1-1: General examination -- Test 1a: Visual examination |
| JIS C 5402-3-1:2005 | Connectors for electronic equipment -- Tests and measurements -- Part 3-1: Insulation tests -- Test 3a: Insulation resistance |
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