JIS C 60068-2-13:1989
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
View Superseded by
Basic environmental testing procedures Part 2: Tests, Test M: Low air pressure Part 2: Tests, Test M: Low air pressure
English
31-07-1989
23-10-2025
This Japanese Industrial Standard specifies the low pressure tests performed at room temperature. The object of this test is to determine the ability of components, equipment or other articles, hereinafter referred to as \"specimens\" to be stored, transported or used under low aie pressure conditions.
| DocumentType |
Standard
|
| Pages |
7
|
| PublisherName |
Japanese Standards Association
|
| Status |
Withdrawn
|
| SupersededBy | |
| Supersedes |
| Standards | Relationship |
| IEC 60068-2-13:1983 | Identical |
Reaffirmed 2015 89(R2015) [20/10/2015]89(R2010) [01/10/2010]89(R1999) [20/06/1999]89 [01/03/1989]
| JIS C 60068-1:1993 | Environmental testing Part 1: General and guidance Part 1: General and guidance |
| JIS C 2570:1998 | Directly heated negative temperature coefficient thermistors |
| JIS C 5260-1:1999 | Potentiometers for use in electronic equipment Part 1: Generic specification Part 1: Generic specification |
| JIS C 6703:2002 | Generic specification of crystal filters |
| JIS C 6703:2008 | Crystal filters |
| JIS C 60068-2-41:1995 | Environmental testing Part 2: Tests, Test Z/BM: Combined dry heat/low air pressure tests Part 2: Tests, Test Z/BM: Combined dry heat/low air pressure tests |
| JIS C 5402:1992 | Method for test of connectors for use in electronic equipment |
| JIS C 6462:1996 | Test methods of variable capacitors for use in electronic equipment |
| JIS C 6701:2007 | Generic specification of quartz crystal units |
| JIS C 6710:2007 | Generic specification of crystal controlled oscillators |
| JIS C 60068-2-61:1996 | Environmental testing Part 2: Test methods Test Z/ABDM: Climatic sequence |
| JIS C 5402-11-11:2005 | Connectors for electronic equipment -- Tests and measurements -- Part 11-11: Climatic tests -- Test 11k: Low air pressure Part 11-11: Climatic tests - Test 11k: Low air pressure |
| JIS C 60068-2-40:1995 | Environmental testing Part 2: Tests, Test Z/AM: Combined cold/low air pressure tests Part 2: Tests, Test Z/AM: Combined cold/low air pressure tests |
| JIS C 5202:1990 | Test methods of fixed resistors for electronic equipment |
| JIS C 5260-2:2000 | Potentiometers for use in electronic equipment -- Part 2: Sectional specification: Lead-screw actuated and rotary preset potentiometers |
| JIS C 5201-1:1998 | Fixed resistors for use in electronic equipment Part 1: Generic specification Part 1: Generic specification |
| JIS C 5260-4:2000 | Potentiometers for use in electronic equipment -- Part 4: Sectional specification: Single-turn rotary power potentiometers |
| JIS C 2570-1:2006 | Directly heated negative temperature coefficient thermistors -- Part 1: Generic specification |
| JIS C 5260-3:2000 | Potentiometers for use in electronic equipment -- Part 3: Sectional specification: Rotary precision potentiometers |
| JIS C 60068-2-39:2004 | Environmental testing -- Part 2: Tests. Test Z/AMD: Combined sequential cold, low air pressure, and damp heat test |
Access your standards online with a subscription
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.
Important note : Users cannot be edited or removed once added to your Multi user PDF.