JIS C 60068-2-13:1989
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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This Japanese Industrial Standard specifies the low pressure tests performed at room temperature. Part 2: Tests, Test M: Low air pressure
Hardcopy , PDF
15-09-2023
Japanese, English
31-07-1989
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This Japanese Industrial Standard specifies the low pressure tests performed at room temperature.
| DocumentType |
Standard
|
| Pages |
0
|
| PublisherName |
Japanese Standards Association
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| Standards | Relationship |
| IEC 60068-2-13:1983 | Identical |
Reaffirmed 2015 89(R2015) [20/10/2015]89(R2010) [01/10/2010]89(R1999) [20/06/1999]89 [01/03/1989]
| JIS C 60068-1:1993 | Environmental testing Part 1: General and guidance |
| JIS C 2570:1998 | Directly heated negative temperature coefficient thermistors |
| JIS C 5260-1:1999 | Potentiometers for use in electronic equipment Part 1: Generic specification |
| JIS C 6703:2002 | Generic specification of crystal filters |
| JIS C 6703:2008 | Crystal filters |
| JIS C 60068-2-41:1995 | Environmental testing Part 2: Tests, Test Z/BM: Combined dry heat/low air pressure tests Part 2: Tests, Test Z/BM: Combined dry heat/low air pressure tests |
| JIS C 5402:1992 | Method for test of connectors for use in electronic equipment |
| JIS C 6462:1996 | Test methods of variable capacitors for use in electronic equipment |
| JIS C 6701:2007 | Generic specification of quartz crystal units |
| JIS C 6710:2007 | Generic specification of crystal controlled oscillators |
| JIS C 60068-2-61:1996 | Environmental testing Part 2: Test methods Test Z/ABDM: Climatic sequence |
| JIS C 5402-11-11:2005 | Connectors for electronic equipment - Tests and measurements Part 11-11: Climatic tests - Test 11k: Low air pressure |
| JIS C 60068-2-40:1995 | Environmental testing Part 2: Tests, Test Z/AM: Combined cold/low air pressure tests |
| JIS C 5202:1990 | Test methods of fixed resistors for electronic equipment |
| JIS C 5260-2:2000 | Potentiometers For Use In Electronic Equipment - Part 2 - Sectional Specification: Lead-screw Actuated And Rotary Preset Potentiometers |
| JIS C 5201-1:1998 | Fixed resistors for use in electronic equipment Part 1: Generic specification |
| JIS C 5260-4:2000 | Potentiometers For Use In Electronic Equipment - Part 4: Sectional Specification: Single-turn Rotary Power Potentiometers |
| JIS C 2570-1:2006 | Directly Heated Negative Temperature Coefficient Thermistors - Part 1: Generic Specification |
| JIS C 5260-3:2000 | Potentiometers For Use In Electronic Equipment - Part 3 - Sectional Specification: Rotary Precision Potentiometers |
| JIS C 60068-2-39:2004 | Environmental Testing - Part 2: Tests - Test Z/amd: Combined Sequential Cold, Low Air Pressure, And Damp Heat Test |
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