JIS C 60068-2-21:2002
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
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Environmental testing -- Part 2-21: Tests -- Test U: Robustness of termination and integral mounting devices Part 2-21: Tests - Test U: Robustness of termination and integral mounting devices
English
30-04-2002
23-10-2025
This Standard is applicable to all electrical and electronic components whose terminations such as lead wires or integral mounting devices are liable to be submitted to stresses during normal assembly or handling operations. Table 1 provides details of the applicable tests.
| DocumentType |
Standard
|
| Pages |
38
|
| PublisherName |
Japanese Standards Association
|
| Status |
Withdrawn
|
| SupersededBy | |
| Supersedes |
| JIS C 6484:2005 | Base materials for printed circuits -- Epoxide woven E-glass laminated sheet of defined flammability (vertical burning test) |
| JIS C 60068-2-61:1996 | Environmental testing Part 2: Test methods Test Z/ABDM: Climatic sequence |
| JIS C 60068-2-20:1996 | Basic environmental testing procedures Part 2: Tests. Test T: Soldering Part 2: Tests. Test T: Soldering |
| JIS C 60068-1:1993 | Environmental testing Part 1: General and guidance Part 1: General and guidance |
| JIS B 1002:1985 | Dimensions of widths across flats |
| JIS Z 8202-3:2000 | Quantities and units -- Part 3: Mechanics |
| JIS Z 3282:2006 | Soft solders -- Chemical compositions and forms |
| JIS C 2570:1998 | Directly heated negative temperature coefficient thermistors |
| JIS C 5321:1997 | Methods of test for high frequency inductors and intermediate frequency transformers for electronic equipment |
| JIS C 6575-4:2005 | Miniature fuses -- Part 4: Universal Modular Fuse-links (UMF) and the other enclosed fuse-links except cartridge and sub-miniature fuse-links Part 4: Universal Modular Fuse-links (UMF) and the other enclosed fuse-links except cartridge and sub-miniature fuse-links |
| JIS C 5260-1:1999 | Potentiometers for use in electronic equipment Part 1: Generic specification Part 1: Generic specification |
| JIS C 6703:2002 | Generic specification of crystal filters |
| JIS C 6703:2008 | Crystal filters |
| JIS C 6114-1:2006 | General rules of optical modulator modules |
| JIS C 5402:1992 | Method for test of connectors for use in electronic equipment |
| JIS C 5381-311:2004 | Components for low-voltage surge protective devices -- Specification for gas discharge tubes (GDT) |
| JIS C 6115-1:2006 | General rules of pin-FET modules |
| JIS C 6575-3:2005 | Miniature fuses -- Part 3: Sub-miniature fuse-link Part 3: Sub-miniature fuse-link |
| JIS C 6691:2003 | Thermal-links -- Requirements and application guide |
| JIS C 6121-5-2:2007 | Optical amplifiers -- Part 5-2: Qualification specifications -- Reliability qualification for optical fiber amplifiers |
| JIS C 60068-1:1993 | Environmental testing Part 1: General and guidance Part 1: General and guidance |
| JIS C 5944:2005 | General rules of laser diode modules for fiber optic transmission |
| JIS C 6462:1996 | Test methods of variable capacitors for use in electronic equipment |
| JIS C 5444:2000 | Testing methods of surface mounting switches for use in electronic equipment |
| JIS C 8917:1998 | Environmental and endurance test methods for crystalline solar PV modules |
| JIS C 6575-2:2005 | Miniature fuses -- Part 2: Cartridge fuse-links Part 2: Cartridge fuse-links |
| JIS C 6701:2007 | Generic specification of quartz crystal units |
| JIS C 6710:2007 | Generic specification of crystal controlled oscillators |
| JIS C 5441:1994 | Testing methods of switches for use in electronic equipment |
| JIS C 5202:1990 | Test methods of fixed resistors for electronic equipment |
| JIS C 5946:2005 | General rules of laser diode modules for optical fiber amplifier |
| JIS C 4908:2007 | Capacitors for electrical apparatus |
| JIS C 5260-5:2000 | Potentiometers for use in electronic equipment -- Part 5: Sectional specification: Single-turn rotary low-power wirewound and non-wirewound potentiometers |
| JIS C 5260-2:2000 | Potentiometers for use in electronic equipment -- Part 2: Sectional specification: Lead-screw actuated and rotary preset potentiometers |
| JIS C 5201-1:1998 | Fixed resistors for use in electronic equipment Part 1: Generic specification Part 1: Generic specification |
| JIS C 5260-4:2000 | Potentiometers for use in electronic equipment -- Part 4: Sectional specification: Single-turn rotary power potentiometers |
| JIS C 60068-2-77:2002 | Environmental testing -- Part 2-77: Tests -- Test 77: Body strength and impact shock |
| JIS C 2570-1:2006 | Directly heated negative temperature coefficient thermistors -- Part 1: Generic specification |
| JIS C 60068-2-47:2008 | Environmental testing -- Part 2-47: Tests -- Mounting of specimens for vibration, impact and similar dynamic tests Part 2-47: Tests - Mounting of specimens for vibration, impact and similar dynamic tests |
| JIS C 5260-3:2000 | Potentiometers for use in electronic equipment -- Part 3: Sectional specification: Rotary precision potentiometers |
| JIS C 6560:1994 | Concentric plugs and jacks |
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