MIL-HDBK-279 Base Document:1985
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Total Dose Hardness Assurance Guideline for Semiconductor Device and Microcircuit (S/S by MIL-HDBK-814)
Available format(s)
PDF
Published date
25-01-1985
Publisher
Superseded date
20-12-2001
Superseded by
€15.75
Excluding VAT
Outlines effects of total-dose radiation on electronic piece parts.
| DevelopmentNote |
NOTICE 1 - Notice of Cancellation/Superseded by MIL HDBK 814. (09/2004)
|
| DocumentType |
Standard
|
| Pages |
63
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Superseded
|
| SupersededBy |
The scope of this document is limited to total-dose radiation effects on electronic piece parts. It does not address overall system hardness assurance activities. However, occasionally, specific system requirements may be briefly addressed when it facilitates the discussion.
| MIL-STD-989 Base Document:1991 | CERTIFICATION REQUIREMENTS FOR JAN SEMICONDUCTOR DEVICES (NO S/S DOCUMENT) |
| MIL-HDBK-817 Base Document:1994 | System Development Radiation Hardness Assurance |
| MIL-HDBK-816 Base Document:1994 | Guidelines for Developing Radiation Hardness Assurance Device Specifications |
| MIL-HDBK-815 Base Document:1994 | Dose-Rate Hardness Assurance Guidelines |
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