MIL-HDBK-280 Base Document:1985
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
NEUTRON HARDNESS ASSURANCE GUIDELINES FOR SEMICONDUCTOR DEVICES AND MICROCIRCUITS
Available format(s)
PDF
Superseded date
20-12-2001
Superseded by
Publisher
Important note : Users cannot be edited or removed once added to your Multi user PDF.Covers neutron radiation effects on piece-part semiconductor microcircuits and devices; hardness assurance.
| DevelopmentNote |
NOTICE 1 - Notice of Cancellation/Superseded by MIL HDBK 814. (09/2004)
|
| DocumentType |
Standard
|
| Pages |
94
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Superseded
|
| SupersededBy |
| MIL-STD-989 Base Document:1991 | CERTIFICATION REQUIREMENTS FOR JAN SEMICONDUCTOR DEVICES |
| MIL-HDBK-817 Base Document:1994 | SYSTEM DEVELOPMENT RADIATION HARDNESS ASSURANCE |
| MIL-HDBK-816 Base Document:1994 | Guidelines for Developing Radiation Hardness Assurance Device Specifications |
| MIL-HDBK-815 Base Document:1994 | DOSE-RATE HARDNESS ASSURANCE GUIDELINES |
| MIL-STD-883 Revision K:2016 | TEST METHOD STANDARD - MICROCIRCUITS |
| MIL-M-38510 Revision J:1991 | MICROCIRCUITS, SPECIFICATION FOR |
| MIL-STD-750 Revision F:2011 | TEST METHODS FOR SEMICONDUCTOR DEVICES |
| MIL S 19500 : J | SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR |
| MIL C 45662 : 0 | CALIBRATION SYSTEM REQUIREMENTS |
| MIL-STD-202 Revision H:2015 | ELECTRONIC AND ELECTRICAL COMPONENT PARTS |
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