MIL-HDBK-280 Base Document:1985
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Neutron Hardness Assurance Guidelines for Semiconductor Devices and Microcircuits (S/S by MIL-HDBK-814)
19-02-1985
20-12-2001
Covers neutron radiation effects on piece-part semiconductor microcircuits and devices; hardness assurance.
| DevelopmentNote |
NOTICE 1 - Notice of Cancellation/Superseded by MIL HDBK 814. (09/2004)
|
| DocumentType |
Standard
|
| Pages |
94
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Superseded
|
| SupersededBy |
Hardness assurance (HA) for electronic piece parts is the application of methods and procedures during the procurement of an electronic piece part to ensure that the radiation response of the purchased part is within known and acceptable limits.
| MIL-STD-989 Base Document:1991 | CERTIFICATION REQUIREMENTS FOR JAN SEMICONDUCTOR DEVICES (NO S/S DOCUMENT) |
| MIL-HDBK-817 Base Document:1994 | System Development Radiation Hardness Assurance |
| MIL-HDBK-816 Base Document:1994 | Guidelines for Developing Radiation Hardness Assurance Device Specifications |
| MIL-HDBK-815 Base Document:1994 | Dose-Rate Hardness Assurance Guidelines |
| MIL-STD-883 Revision K:2016 | Microcircuits |
| MIL-M-38510 Revision J:1991 | Microcircuits, General Specification for |
| MIL-STD-750 Revision F:2011 | Test Methods for Semiconductor Devices |
| MIL S 19500 : J | SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR |
| MIL C 45662 : 0 | CALIBRATION SYSTEM REQUIREMENTS |
| MIL-STD-202 Revision H:2015 | Electronic and Electrical Component Parts |
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