MIL-HDBK-814 Base Document:1994
Current
The latest, up-to-date edition.
IONIZING DOSE AND NEUTRON HARDNESS ASSURANCE GUIDELINES FOR MICROCIRCUITS AND SEMICONDUCTOR DEVICES
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1. SCOPE
1.1 Background
1.2 Overview
1.3 Limitation
2. REFERENCED DOCUMENTS
2.1 Government documents
3. DEFINITIONS, ACRONYMS AND SYMBOLS
3.1 Definitions
3.2 Acronyms and symbols
4. GENERAL HARDNESS ASSURANCE REQUIREMENTS
4.1 Radiation environments and effects
5. DETAILED HARDNESS ASSURANCE REQUIREMENTS
5.1 Radiation design hardening
5.2 Hardness assurance, maintenance, and surveillance
5.3 Radiation response measurements
5.4 Design margins and hardness critical categories
5.5 DMBP method
5.6 PCC method
5.7 Combined DMBP/PCC methods
5.8 Hardness assurance testing
6.0 References
APPENDIX
Statistical techniques for hardness assurance
Figures
Tables
Describes the systems that must operate in radiation environment have to be designed to be survivable (hard) to radiation stress levels specified for them.
| Committee |
FSC 59GP
|
| DevelopmentNote |
Supersedes MIL HDBK 279 and MIL HDBK 280. (09/2004) NOTICE 1 - Notice of Validation. (02/2015) NEW CHILD NOT 2 2021 IS NOW ADDED
|
| DocumentType |
Standard
|
| Pages |
113
|
| ProductNote |
NEW CHILD NOT 2 2021 IS NOW ADDED
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Current
|
| Supersedes |
| BS EN 16602-60-15:2014 | Space product assurance. Radiation hardness assurance. EEE components |
| SAE AS6294/1 | Requirements for Plastic Encapsulated Microcircuits in Space Applications |
| MIL-HDBK-817 Base Document:1994 | SYSTEM DEVELOPMENT RADIATION HARDNESS ASSURANCE |
| MIL-HDBK-816 Base Document:1994 | Guidelines for Developing Radiation Hardness Assurance Device Specifications |
| MIL-PRF-38535 Revision K:2013 | Integrated Circuits (Microcircuits) Manufacturing, General Specification for |
| I.S. EN 16602-60-15:2014 | SPACE PRODUCT ASSURANCE - RADIATION HARDNESS ASSURANCE - EEE COMPONENTS |
| EN 16602-60-15:2014 | Space product assurance - Radiation hardness assurance - EEE components |
| MIL-PRF-38534 Revision K:2017 | HYBRID MICROCIRCUITS, GENERAL SPECIFICATION FOR |
| MIL-STD-1546 Revision B:1992 | PARTS, MATERIALS, AND PROCESSES CONTROL PROGRAM FOR SPACE AND LAUNCH VEHICLES |
| MIL-STD-883 Revision K:2016 | TEST METHOD STANDARD - MICROCIRCUITS |
| MIL-STD-1547 Revision B:1992 | ELECTRONIC PARTS, MATERIALS, AND PROCESSES FOR SPACE VEHICLES |
| MIL-STD-750 Revision F:2011 | TEST METHODS FOR SEMICONDUCTOR DEVICES |
| MIL I 38535 : B (1) | INTEGRATED CIRCUITS (MICROCIRCUITS) MANUFACTURING, GENERAL SPECIFICATION FOR |
| MIL-STD-414 Base Document:1957 | SAMPLING PROCEDURE AND TABLE FOR INSPECTION BY VARIABLES FOR PERCENT DEFECTIVE |
| MIL-STD-1562 Revision W:1991 | LISTS OF STANDARD MICROCIRCUITS |
| MIL-HDBK-816 Base Document:1994 | Guidelines for Developing Radiation Hardness Assurance Device Specifications |
| MIL-HDBK-780 Revision D:2004 | STANDARD MICROCIRCUIT DRAWINGS |
| MIL S 19500 : J | SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR |
| MIL-STD-100 Revision G:1997 | ENGINEERING DRAWINGS |
| MIL H 38534 : B (1) | HYBRID MICROCIRCUITS, GENERAL SPECIFICATION FOR |
| MIL-STD-202 Revision H:2015 | ELECTRONIC AND ELECTRICAL COMPONENT PARTS |
| MIL-HDBK-339 Base Document:1984 | CUSTOM LARGE SCALE INTEGRATED CIRCUIT DEVELOPMENT & ACQUISITION FOR SPACE VEHICLES |
| MIL-STD-105 Revision E:1989 | SAMPLING PROCEDURES AND TABLES FOR INSPECTION BY ATTRIBUTES |
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