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MIL-HDBK-815 Base Document:1994

Current

Current

The latest, up-to-date edition.

Dose-Rate Hardness Assurance Guidelines

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PDF

Published date

07-11-1994

€16.67
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Primarily discusses piece-part hardness assurance methods for the dose-rate environment.

DevelopmentNote
CHANGE 1 - Notice of Change. (01/2002) NOTICE 1 - Notice of Validation. (11/2006) NOTICE 3 - Notice of Validation. NOTICE 4 - Notice of Validation. (08/2017)
DocumentType
Standard
Pages
62
PublisherName
US Military Specs/Standards/Handbooks
Status
Current

The scope of this document is limited to dose-rate radiation effects on semiconductor electronics and is specifically intended to address hardness assurance at the piece-part level. Because the nature of dose-rate effects sometimes requires a close interaction between system hardness assurance and piece-part hardness assurance, some system requirements are also discussed.

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MIL-HDBK-279 Base Document:1985 Total Dose Hardness Assurance Guideline for Semiconductor Device and Microcircuit (S/S by MIL-HDBK-814)
ASTM F 675 : 1991 Test Method for Measuring Nonequilibrium Transient Photocurrents in P-N Junctions (Withdrawn 1995)
MIL-M-38510 Revision J:1991 Microcircuits, General Specification for
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MIL S 19500 : J SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR
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MIL-HDBK-280 Base Document:1985 Neutron Hardness Assurance Guidelines for Semiconductor Devices and Microcircuits (S/S by MIL-HDBK-814)
ASTM E 666 : 2014 : REDLINE Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation
ASTM F 448 : 2011-07 TEST METHOD FOR MEASURING STEADY-STATE PRIMARY PHOTOCURRENT
ASTM E 820 : 1981 Practice for Determining Absolute Absorbed Dose Rates for Electron Beams (Withdrawn 1987)
ASTM F 773 : 1992 Practice for Measuring Dose Rate Response of Linear Integrated Circuits

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€16.67
Excluding VAT