MIL-HDBK-815 Base Document:1994
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The latest, up-to-date edition.
DOSE-RATE HARDNESS ASSURANCE GUIDELINES
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Important note : Users cannot be edited or removed once added to your Multi user PDF.Primarily discusses piece-part hardness assurance methods for the dose-rate environment.
| Committee |
FSC 59GP
|
| DevelopmentNote |
CHANGE 1 - Notice of Change. (01/2002) NOTICE 1 - Notice of Validation. (11/2006) NOTICE 3 - Notice of Validation. NOTICE 4 - Notice of Validation. (08/2017)
|
| DocumentType |
Standard
|
| Pages |
61
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Current
|
| MIL-HDBK-817 Base Document:1994 | SYSTEM DEVELOPMENT RADIATION HARDNESS ASSURANCE |
| MIL-PRF-38535 Revision K:2013 | Integrated Circuits (Microcircuits) Manufacturing, General Specification for |
| MIL-PRF-38534 Revision K:2017 | HYBRID MICROCIRCUITS, GENERAL SPECIFICATION FOR |
| ASTM E 665 : 1994 | Practice for Using Absorbed Dose Versus Depth in Materials to Verify the X-ray Output of Flash X-ray Machines (Withdrawn 2000) |
| MIL-STD-883 Revision K:2016 | TEST METHOD STANDARD - MICROCIRCUITS |
| ASTM F 526 : 2016 : REDLINE | Standard Test Method for Using Calorimeters for Total Dose Measurements in Pulsed Linear Accelerator or Flash X-ray Machines |
| MIL-STD-45662 Revision A:1988 | CALIBRATION SYSTEMS REQUIREMENTS |
| MIL-HDBK-279 Base Document:1985 | TOTAL DOSE HARDNESS ASSURANCE GUIDELINE FOR SEMICONDUCTOR DEVICE & MICROCIRCUIT |
| ASTM F 675 : 1991 | Test Method for Measuring Nonequilibrium Transient Photocurrents in P-N Junctions (Withdrawn 1995) |
| MIL-M-38510 Revision J:1991 | MICROCIRCUITS, SPECIFICATION FOR |
| MIL-STD-750 Revision F:2011 | TEST METHODS FOR SEMICONDUCTOR DEVICES |
| MIL I 38535 : B (1) | INTEGRATED CIRCUITS (MICROCIRCUITS) MANUFACTURING, GENERAL SPECIFICATION FOR |
| ASTM E 668 : 2013 : REDLINE | Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices |
| MIL-HDBK-816 Base Document:1994 | Guidelines for Developing Radiation Hardness Assurance Device Specifications |
| MIL S 19500 : J | SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR |
| MIL-STD-202 Revision H:2015 | ELECTRONIC AND ELECTRICAL COMPONENT PARTS |
| DODISS : 1999 | DEPARTMENT OF DEFENSE INDEX OF STANDARDS AND SPECIFICATIONS |
| MIL-HDBK-280 Base Document:1985 | NEUTRON HARDNESS ASSURANCE GUIDELINES FOR SEMICONDUCTOR DEVICES AND MICROCIRCUITS |
| ASTM E 666 : 2014 : REDLINE | Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation |
| ASTM F 448 : 2011-07 | TEST METHOD FOR MEASURING STEADY-STATE PRIMARY PHOTOCURRENT |
| ASTM E 820 : 1981 | Practice for Determining Absolute Absorbed Dose Rates for Electron Beams (Withdrawn 1987) |
| ASTM F 773 : 1992 | Practice for Measuring Dose Rate Response of Linear Integrated Circuits |
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