MIL-HDBK-816 Base Document:1994
Current
The latest, up-to-date edition.
Guidelines for Developing Radiation Hardness Assurance Device Specifications
09-12-1994
Important note : Users cannot be edited or removed once added to your Multi user PDF.Provides guidelines and easy to follow procedures for the preparation of detailed device specifications for the procurement of microcircuits and semiconductor devices where radiation Hardness Assurance is required.
| DevelopmentNote |
CHANGE 1 - Notice of Change. (04/2002) NOTICE 1 - Notice of Validation. (04/2007) NOTICE 3 - Notice of Validation. (03/2018)
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| DocumentType |
Standard
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| Pages |
107
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| ProductNote |
NEW CHILD NOT 3 2018 IS NOW ADDED
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| PublisherName |
US Military Specs/Standards/Handbooks
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| Status |
Current
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The primary objective of this document is to provide guidelines and easy to follow procedures for the preparation of detailed device specifications for the procurement of microcircuits and semiconductor devices where radiation Hardness Assurance (RHA) is required. The guidelines are applicable to MIL-M-38510, MIL-PRF-38534, MIL-PRF-38535, and MIL-PRF-19500 microcircuit and semiconductor device detailed specifications, Standard Microcircuit Drawings (SMDs) as well as other contractor prepared specifications such as Source Control Drawings (SOCD), Selected Item Drawings (SID), and Specification Control Drawings (SCD). Recommended procedures are provided for characterizing the radiation response of a part and for obtaining post-irradiation post-irradiation end-point limits for qualification and Lot Acceptance Tests (LAT).
| MIL-HDBK-817 Base Document:1994 | SYSTEM DEVELOPMENT RADIATION HARDNESS ASSURANCE |
| MIL-HDBK-814 Base Document:1994 | IONIZING DOSE AND NEUTRON HARDNESS ASSURANCE GUIDELINES FOR MICROCIRCUITS AND SEMICONDUCTOR DEVICES |
| MIL-HDBK-815 Base Document:1994 | DOSE-RATE HARDNESS ASSURANCE GUIDELINES |
| MIL-HDBK-814 Base Document:1994 | IONIZING DOSE AND NEUTRON HARDNESS ASSURANCE GUIDELINES FOR MICROCIRCUITS AND SEMICONDUCTOR DEVICES |
| MIL-STD-883 Revision K:2016 | TEST METHOD STANDARD - MICROCIRCUITS |
| MIL-HDBK-279 Base Document:1985 | TOTAL DOSE HARDNESS ASSURANCE GUIDELINE FOR SEMICONDUCTOR DEVICE & MICROCIRCUIT |
| MIL-M-38510 Revision J:1991 | MICROCIRCUITS, SPECIFICATION FOR |
| MIL-STD-750 Revision F:2011 | TEST METHODS FOR SEMICONDUCTOR DEVICES |
| MIL S 19500 : J | SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR |
| MIL-HDBK-339 Base Document:1984 | CUSTOM LARGE SCALE INTEGRATED CIRCUIT DEVELOPMENT & ACQUISITION FOR SPACE VEHICLES |
| MIL-HDBK-280 Base Document:1985 | NEUTRON HARDNESS ASSURANCE GUIDELINES FOR SEMICONDUCTOR DEVICES AND MICROCIRCUITS |
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