NBN EN 60749-11 : 2003
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 11: RAPID CHANGE OF TEMPERATURE - TWO-FLUID-BATH METHOD
12-01-2013
Foreword
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Procedure
6 Summary
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Describes the rapid change of temperature test method and the two-fluid-bath method. It is applicable to all semiconductor devices.
| DocumentType |
Standard
|
| PublisherName |
Belgian Standards
|
| Status |
Current
|
| Standards | Relationship |
| DIN EN 60749-11:2003-04 | Identical |
| BS EN 60749-11:2002 | Identical |
| EN 60749-11:2002 | Identical |
| UNE-EN 60749-11:2003 | Identical |
| I.S. EN 60749-11:2002 | Identical |
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