EN 60749-11:2002
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
16-08-2002
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Procedure
6 Summary
Annex ZA (normative) - Normative references to international
publications with their corresponding European
publications
Defines the rapid change of temperature test method and the two-fluid-bath method. This test method may also be used, employing fewer cycles, to test the effect of immersion in heated liquids that are used for the purpose of cleaning devices. This test is applicable to all semiconductor devices. It is considered destructive unless otherwise detailed in the relevant specification.
| Committee |
CLC/TC 47X
|
| DevelopmentNote |
Supersedes EN 60749. (06/2017)
|
| DocumentType |
Standard
|
| PublisherName |
European Committee for Standards - Electrical
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| NF EN 60749-11 : 2002 | Identical |
| IEC 60749-11:2002 | Identical |
| NBN EN 60749-11 : 2003 | Identical |
| NEN EN IEC 60749-11 : 2002 | Identical |
| I.S. EN 60749-11:2002 | Identical |
| PN EN 60749-11 : 2004 | Identical |
| BS EN 60749-11:2002 | Identical |
| CEI EN 60749-11 : 2004 | Identical |
| DIN EN 60749-11:2003-04 | Identical |
| UNE-EN 60749-11:2003 | Identical |