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  • BS EN 60749-11:2002

    Current The latest, up-to-date edition.

    Semiconductor devices. Mechanical and climatic test methods Rapid change of temperature. Two-fluid-bath method

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  24-10-2003

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    Foreword
    INTRODUCTION
    1 Scope
    2 Normative references
    3 Terms and definitions
    4 Test apparatus
    5 Procedure
    6 Summary
    Annex ZA (normative) Normative references to international
             publications with their corresponding European
             publications

    Abstract - (Show below) - (Hide below)

    Describes the rapid change of temperature test method and the two-fluid-bath method. It is applicable to all semiconductor devices.

    Scope - (Show below) - (Hide below)

    Defines the rapid change of temperature test method and the two-fluid-bath method. This test method may also be used, employing fewer cycles, to test the effect of immersion in heated liquids that are used for the purpose of cleaning devices. This test is applicable to all semiconductor devices. It is considered destructive unless otherwise detailed in the relevant specification. The contents of the corrigenda of January 2003 and August 2003 have been included in this copy.

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    Committee EPL/47
    Development Note Supersedes 00/203570 DC (10/2002) Supersedes BS EN 60749. (09/2005)
    Document Type Standard
    Publisher British Standards Institution
    Status Current
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60749-3:2017 Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination
    EN 60749-3:2017 Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination
    IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
    EN 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
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