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NEN EN IEC 60191-6-21 : 2010

Current

Current

The latest, up-to-date edition.

MECHANICAL STANDARDIZATION OF SEMICONDUCTOR DEVICES - PART 6-21: GENERAL RULES FOR THE PREPARATION OF OUTLINE DRAWINGS OF SURFACE MOUNTED SEMICONDUCTOR DEVICE PACKAGES - MEASURING METHODS FOR PACKAGE DIMENSIONS OF SMALL OUTLINE PACKAGES (SOP)

Published date

12-01-2013

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Defines methods to measure package dimensions of small outline packages (SOP), package outline form E in accordance to IEC 60191-4.

DocumentType
Standard
PublisherName
Netherlands Standards
Status
Current

Standards Relationship
EN 60191-6-21 : 2010 Identical
IEC 60191-6-21:2010 Identical

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