NEN EN IEC 60749-28 : 2017

Current

Current The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 28: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - CHARGED DEVICE MODEL (CDM) - DEVICE LEVEL

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Published date: 22-08-2017

Publisher: Netherlands Standards

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Defines the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-induced charged device model (CDM) electrostatic discharge (ESD).

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Document Type	Standard
ISBN
Pages
Published
Publisher	Netherlands Standards
Status	Current

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Equivalent Standard(s)	Relationship
EN 60749-28:2017	Identical
IEC 60749-28:2017	Identical

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