NEN EN IEC 61967-4 : 2002 C1 2017
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INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 4: MEASUREMENT OF CONDUCTED EMISSIONS - 1 /150 DIRECT COUPLING METHOD
Published date
12-01-2013
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States a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| EN 61967-4 : 2002 COR 2017 | Identical |
| IEC 61967-4:2002+AMD1:2006 CSV | Identical |
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