• EN 61967-4 : 2002 COR 2017

    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

    INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 4: MEASUREMENT OF CONDUCTED EMISSIONS - 1 OHM/150 OHM DIRECT COUPLING METHOD (IEC 61967-4:2002/COR1:2017)

    Available format(s): 

    Superseded date:  12-02-2022

    Language(s): 

    Published date:  13-01-2013

    Publisher:  European Committee for Standards - Electrical

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    1 Scope
    2 Normative references
    3 Definitions
    4 General
      4.1 Measurement basics
      4.2 RF current measurement
      4.3 RF voltage measurement at IC pins
      4.4 Assessment of the measurement technique
    5 Test conditions
    6 Test equipment
      6.1 Test receiver specification
      6.2 RF current probe specification
      6.3 Test of the RF current probe capability
      6.4 Matching network specification
    7 Test set-up
      7.1 General test configuration
      7.2 Printed circuit test board layout
    8 Test procedure
    9 Test report
    Annex A (normative) Probe calibration procedure
    Annex B (informative) Classification of conducted
                           emission levels
      B.1 Introductory remark
      B.2 General
      B.3 Definition of emission levels
      B.4 Presentation of results
    Annex C (informative) Example of reference levels for
                           automotive applications
      C.1 Introductory remark
      C.2 General
      C.3 Reference levels
    Annex D (informative) EMC requirements and how to use
                           EMC IC measurement techniques
      D.1 Introduction
      D.2 Using EMC measurement procedures
      D.3 Assessment of the IC influence to the EMC behaviour
          of the modules
    Annex E (informative) Example of a test set-up consisting of
                           an EMC main test board and an EMC
                           IC test board
      E.1 The EMC main test board
      E.2 EMC IC test board
    Annex F (informative) 150 ohms direct coupling networks for
            common mode emission measurements of differential
            mode data transfer ICs and similar circuits
    Annex ZA (normative) Normative references to international
                           publications with their corresponding
                           European publications

    Abstract - (Show below) - (Hide below)

    Specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 ohm resistive probe and RF voltage measurement using a 150 ohm coupling network.

    General Product Information - (Show below) - (Hide below)

    Committee SR 47A
    Document Type Standard
    Publisher European Committee for Standards - Electrical
    Status Superseded
    Superseded By
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    BS EN 62228-2:2017 (published 2017-02) Integrated circuits. EMC evaluation of transceivers LIN transceivers
    EN 62132-4 : 2006 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY 150 KHZ TO 1 GHZ - PART 4: DIRECT RF POWER INJECTION METHOD
    CEI EN 62228-2 : 1ED 2017 INTEGRATED CIRCUITS - EMC EVALUATION OF TRANSCEIVERS - PART 2: LIN TRANSCEIVERS
    BS EN 61967-6 : 2002 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 6: MEASUREMENT OF CONDUCTED EMISSIONS - MAGNETIC PROBE METHOD
    I.S. EN 62228-2:2017 INTEGRATED CIRCUITS - EMC EVALUATION OF TRANSCEIVERS - PART 2: LIN TRANSCEIVERS
    EN IEC 62969-1 : 2018 SEMICONDUCTOR DEVICES - SEMICONDUCTOR INTERFACE FOR AUTOMOTIVE VEHICLES - PART 1: GENERAL REQUIREMENTS OF POWER INTERFACE FOR AUTOMOTIVE VEHICLE SENSORS (IEC 62969-1:2017)
    CEI EN 62132-4 : 2006 CIRCUITS INTEGRES - MESURE DE L'IMMUNITE ELECTROMAGNETIQUE 150 KHZ A 1 GHZ - PARTIE 4: METHODE D'INJECTION DIRECTE DE PUISSANCE RF
    BS EN 62132-4:2006 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY 150 KHZ TO 1 GHZ - PART 4: DIRECT RF POWER INJECTION METHOD
    EN 61967-6:2002/A1:2008 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 6: MEASUREMENT OF CONDUCTED EMISSIONS - MAGNETIC PROBE METHOD
    I.S. EN 61967-6:2003 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 6: MEASUREMENT OF CONDUCTED EMISSIONS - MAGNETIC PROBE METHOD
    I.S. EN 62132-4:2006 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY 150 KHZ TO 1 GHZ - PART 4: DIRECT RF POWER INJECTION METHOD
    EN 62228-2 : 2017 INTEGRATED CIRCUITS - EMC EVALUATION OF TRANSCEIVERS - PART 2: LIN TRANSCEIVERS (IEC 62228-2:2016)

    Standards Referencing This Book - (Show below) - (Hide below)

    EN 55016-1-4:2010/A2:2017 SPECIFICATION FOR RADIO DISTURBANCE AND IMMUNITY MEASURING APPARATUS AND METHODS - PART 1-4: RADIO DISTURBANCE AND IMMUNITY MEASURING APPARATUS - ANTENNAS AND TEST SITES FOR RADIATED DISTURBANCE MEASUREMENTS (CISPR 16-1-4:2010/A2:2017)
    IEC 61967-1:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
    CISPR 16-1-4:2010+AMD1:2012+AMD2:2017 CSV Specification for radio disturbance and immunity measuring apparatus and methods - Part 1-4: Radio disturbance and immunity measuring apparatus - Antennas and test sites for radiated disturbance measurements
    CISPR 16-1-1:2015 Specification for radio disturbance and immunity measuring apparatus and methods - Part 1-1: Radio disturbance and immunity measuring apparatus - Measuring apparatus
    CISPR 16-1-3:2004+AMD1:2016 CSV Specification for radio disturbance and immunity measuring apparatus and methods - Part 1-3: Radio disturbance and immunity measuring apparatus - Ancillary equipment - Disturbance power
    CISPR 16-1-5:2014+AMD1:2016 CSV Specification for radio disturbance and immunity measuring apparatus and methods - Part 1-5: Radio disturbance and immunity measuring apparatus - Antenna calibration sites and reference test sites for 5 MHz to 18 GHz
    EN 61967-1 : 2002 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 1: GENERAL CONDITIONS AND DEFINITIONS
    IEC 61000-4-6 : 4.0 ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-6: TESTING AND MEASUREMENT TECHNIQUES - IMMUNITY TO CONDUCTED DISTURBANCES, INDUCED BY RADIO-FREQUENCY FIELDS
    EN 55016-1-5:2015/A1:2017 SPECIFICATION FOR RADIO DISTURBANCE AND IMMUNITY MEASURING APPARATUS AND METHODS - PART 1-5: RADIO DISTURBANCE AND IMMUNITY MEASURING APPARATUS - ANTENNA CALIBRATION SITES AND REFERENCE TEST SITES FOR 5 MHZ TO 18 GHZ (CISPR 16-1-5:2014/A1:2016)
    EN 55016-1-3:2006/A1:2016 SPECIFICATION FOR RADIO DISTURBANCE AND IMMUNITY MEASURING APPARATUS AND METHODS - PART 1-3: RADIO DISTURBANCE AND IMMUNITY MEASURING APPARATUS - ANCILLARY EQUIPMENT - DISTURBANCE POWER (CISPR 16-1-3:2004)
    EN 61000-4-6:2014/AC:2015 ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-6: TESTING AND MEASUREMENT TECHNIQUES - IMMUNITY TO CONDUCTED DISTURBANCES, INDUCED BY RADIO-FREQUENCY FIELDS (IEC 61000-4-6:2013)
    EN 55016-1-1:2010/A2:2014 SPECIFICATION FOR RADIO DISTURBANCE AND IMMUNITY MEASURING APPARATUS AND METHODS - PART 1-1: RADIO DISTURBANCE AND IMMUNITY MEASURING APPARATUS - MEASURING APPARATUS (CISPR 16-1-1:2010/A2:2014)
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