NEN EN IEC 61967-6 : 2002 C1 2010
Current
The latest, up-to-date edition.
INTEGRATED CIRCUITS; MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ; PART 6: MEASUREMENT OF CONDUCTED EMISSIONS; MAGNETIC PROBE METHOD
12-01-2013
Defines a method for evaluating RF currents on the pins of an integrated circuit (IC) by means of non-contact current measurement using a miniature magnetic probe. This method is capable of measuring the RF currents generated by the IC over a frequency range of 0,15 MHz to 1000 MHz. This method is applicable to the measurement of a single IC or a chip set if ICs on the standardized test board for characterization and comparison purposes.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| IEC 61967-6:2002+AMD1:2008 CSV | Identical |
| EN 61967-6:2002/A1:2008 | Identical |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.