NF EN 60749-24 : 2005
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 24: ACCELERATED MOISTURE RESISTANCE - UNBIASED HAST
12-01-2013
AVANT-PROPOS
1 Domaine d'application et objet
2 Références normatives
3 Appareillage
3.1 Enregistrements
3.2 Dispositifs sous contrainte
3.3 Contamination ionique
3.4 Eau distillée ou dé ionisée
4 Exigences générales
5 Conditions d'essai
6 Procédure
6.1 Constitution des conditions d'essais
6.2 Retour aux conditions initiales
6.3 Horloge d'Essai
6.4 Essais électriques
6.5 Manipulation
7 Critères de défaillance
8 Sécurité
9 Résumé
Specifies temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.
| DevelopmentNote |
Indice de classement: C96-022-24 (12/2005)
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| DocumentType |
Standard
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| PublisherName |
Association Francaise de Normalisation
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| Status |
Current
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| Standards | Relationship |
| DIN EN 60749-24:2004-09 | Identical |
| EN 60749-24:2004 | Identical |
| BS EN 60749-24:2004 | Identical |
| IEC 60749-24:2004 | Identical |
| UNE-EN 60749-24:2005 | Identical |
| I.S. EN 60749-24:2004 | Identical |
| NF EN 60749-30 : 2005 AMD 1 2011 | SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 30: PRECONDITIONING OF NON-HERMETIC SURFACE MOUNT DEVICES PRIOR TO RELIABILITY TESTING |
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