NF EN 60749-37 : 2008
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The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 37: BOARD LEVEL DROP TEST METHOD USING AN ACCELEROMETER
Published date
12-01-2013
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| DevelopmentNote |
Indice de classement: C96-022-37. PR NF EN 60749-37 March 2006. (03/2006)
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| DocumentType |
Standard
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| PublisherName |
Association Francaise de Normalisation
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| Status |
Current
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| Standards | Relationship |
| EN 60749-37:2008 | Identical |
| IEC 60749-37:2008 | Identical |
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