NF EN 60749-40 : 2012
Current
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 40: BOARD LEVEL DROP TEST METHOD USING A STRAIN GAUGE
Published date
12-01-2013
Publisher
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| DevelopmentNote |
Indice de classement: C96-022-40. PR NF EN 60749-40 July 2010. (07/2010)
|
| DocumentType |
Standard
|
| PublisherName |
Association Francaise de Normalisation
|
| Status |
Current
|
| Standards | Relationship |
| EN 60749-40 : 2011 | Identical |
| IEC 60749-40:2011 | Identical |
| IEC 60749-37:2008 | Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer |
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