PD ES 59008-2:1999
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
View Superseded by
Data requirements for semiconductor die Vocabulary
Hardcopy , PDF
26-10-2018
English
15-12-1999
Specifies vocabulary requirements for the exchange of data pertaining to bare semiconductor die, with or without connection structures, and minimally-packaged semiconductor die.
Committee |
EPL/47
|
DocumentType |
Standard
|
Pages |
24
|
PublisherName |
British Standards Institution
|
Status |
Withdrawn
|
SupersededBy |
Standards | Relationship |
ES 59008-2 : 1999 | Identical |
IEC 60068-1:2013 | Environmental testing - Part 1: General and guidance |
MIL-STD-883 Revision K:2016 | TEST METHOD STANDARD - MICROCIRCUITS |
ISO/IEC 11179-3:2013 | Information technology — Metadata registries (MDR) — Part 3: Registry metamodel and basic attributes |
MIL-PRF-19500 Revision P:2010 | SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR |
EIA 554 : 1996 | METHOD SELECTION FOR ASSESSMENT OF NONCONFORMING LEVELS IN PARTS PER MILLION (PPM) |
MIL-PRF-38534 Revision J:2015 | HYBRID MICROCIRCUITS, GENERAL SPECIFICATION FOR |
IEEE 1364-2005 | IEEE Standard for Verilog Hardware Description Language |
FED-STD-209 Revision E:1992 | AIRBORNE PARTICULATE CLEANLINESS CLASSES IN CLEANROOMS AND CLEAN ZONES |
IEC 61360-1:2017 | Standard data element types with associated classification scheme - Part 1: Definitions - Principles and methods |
IEEE 1076-2008 REDLINE | IEEE Standard VHDL Language Reference Manual |
ES 59008-1 : 1999 | DATA REQUIREMENTS FOR SEMICONDUCTOR DIE - PART 1 - GENERAL REQUIREMENTS |
ISO 8879:1986 | Information processing Text and office systems Standard Generalized Markup Language (SGML) |
ISO 9000:2015 | Quality management systems — Fundamentals and vocabulary |
EIA 557 : 2006 | STATISTICAL PROCESS CONTROL SYSTEMS |
IEEE 1149.1-2013 REDLINE | IEEE Standard for Test Access Port and Boundary-Scan Architecture |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.