PD IEC/TR 61967-1-1:2015
Current
The latest, up-to-date edition.
Integrated circuits. Measurement of electromagnetic emissions General conditions and definitions. Near-field scan data exchange format
Hardcopy , PDF
English
30-09-2015
Committee |
EPL/47
|
DocumentType |
Standard
|
Pages |
68
|
PublisherName |
British Standards Institution
|
Status |
Current
|
Supersedes |
This part of IEC 61967 provides guidance for exchanging data generated by near-field scan measurements.
The described exchange format could also be used for near-field scan data generated by simulation or computation software. It should be noted that, although it has been developed for near-field scan, its use is not restricted to this application. The exchange format can be applied to emission and immunity near-field scan data in the frequency and time domains.
The scope of this technical report includes neither the methods used for the measurements or simulations, nor the software and algorithms used for generating the exchange file or for processing or viewing the data contained therein.
Standards | Relationship |
IEC TR 61967-1-1:2015 | Identical |
IEC 60050-131:2002 | International Electrotechnical Vocabulary (IEV) - Part 131: Circuit theory |
IEC TS 62132-9:2014 | Integrated circuits - Measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method |
IEC 61967-1:2002 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions |
IEC TS 61967-3:2014 | Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method |
IEC 62132-1:2015 | Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions |
ISO 8879:1986 | Information processing Text and office systems Standard Generalized Markup Language (SGML) |
IEEE 754-2008 REDLINE | IEEE Standard for Floating-Point Arithmetic |
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