PD ISO/TR 14187:2011
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Surface chemical analysis. Characterization of nanostructured materials
Hardcopy , PDF
03-07-2020
English
31-08-2011
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Foreword
Introduction
1 Scope
2 Terms and definitions
3 Symbols and abbreviated terms
4 Characterization of nanostructured materials with surface
analysis methods
5 Analysis considerations, issues and challenges associated
with characterization of nanostructured materials:
Information for the analyst.
6 General characterization needs and opportunities for
nanostructured materials
Bibliography
Gives an introduction to (and some examples of) the types of information that can be obtained about nanostructured materials using surface-analysis tools.
| Committee |
CII/60
|
| DocumentType |
Standard
|
| Pages |
50
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| ISO/TR 14187:2011 | Identical |
| ASTM E 1078 : 2014 : REDLINE | Standard Guide for Specimen Preparation and Mounting in Surface Analysis |
| ISO/TR 15969:2001 | Surface chemical analysis Depth profiling Measurement of sputtered depth |
| ISO/TR 22335:2007 | Surface chemical analysis Depth profiling Measurement of sputtering rate: mesh-replica method using a mechanical stylus profilometer |
| ISO 18516:2006 | Surface chemical analysis Auger electron spectroscopy and X-ray photoelectron spectroscopy Determination of lateral resolution |
| ISO 18116:2005 | Surface chemical analysis — Guidelines for preparation and mounting of specimens for analysis |
| ISO/TR 19319:2013 | Surface chemical analysis Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods |
| ISO 11952:2014 | Surface chemical analysis Scanning-probe microscopy Determination of geometric quantities using SPM: Calibration of measuring systems |
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