SAE AS 6171/3 : 2016
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY X-RAY FLUORESCENCE TEST METHODS
Hardcopy , PDF
04-03-2024
English
30-10-2016
Important note : Users cannot be edited or removed once added to your Multi user PDF.
1. SCOPE
2. REFERENCES
3. DESCRIPTION OF METHODOLOGY/PROCEDURE
4. TEST EQUIPMENT AND CALIBRATION
5. REQUIREMENTS
6. NOTES
Gives information and instructions on how to use XRF as a technique to verify the materials and finishes of EEE parts to compare with the original design, construction and material requirements.
| Committee |
G-19A
|
| DocumentType |
Test Method
|
| Pages |
22
|
| PublisherName |
SAE International
|
| Status |
Superseded
|
| SupersededBy |
| 18/30373170 DC : 0 | BS EN 62668-2 - PROCESS MANAGEMENT FOR AVIONICS - COUNTERFEIT PREVENTION - PART 2: MANAGING ELECTRONIC COMPONENTS FROM NON-FRANCHISED SOURCES |
| SAE AS 6171 : 2016 | TEST METHODS STANDARD; GENERAL REQUIREMENTS, SUSPECT/COUNTERFEIT, ELECTRICAL, ELECTRONIC, AND ELECTROMECHANICAL PARTS |
| IEC TS 62668-2:2016 | Process management for avionics - Counterfeit prevention - Part 2: Managing electronic components from non-franchised sources |
| PD IEC/TS 62668-2:2016 | Process management for avionics. Counterfeit prevention Managing electronic components from non-franchised sources |
| ISO/IEC 17025:2005 | General requirements for the competence of testing and calibration laboratories |
| SAE AS 5553B : 2016 | COUNTERFEIT ELECTRICAL, ELECTRONIC, AND ELECTROMECHANICAL (EEE) PARTS; AVOIDANCE, DETECTION, MITIGATION, AND DISPOSITION |
| SAE AS 6171 : 2016 | TEST METHODS STANDARD; GENERAL REQUIREMENTS, SUSPECT/COUNTERFEIT, ELECTRICAL, ELECTRONIC, AND ELECTROMECHANICAL PARTS |
| NAS410:2003 | NAS CERTIFICATION & QUALIFICATION OF NONDESTRUCTIVE TEST PERSONNEL |
| ISO 3497:2000 | Metallic coatings Measurement of coating thickness X-ray spectrometric methods |
| MIL-STD-1580 Revision B:2003 | DESTRUCTIVE PHYSICAL ANALYSIS FOR ELECTRONIC, ELECTROMAGNETIC, AND ELECTROMECHANICAL PARTS |
| MIL-PRF-38535 Revision K:2013 | Integrated Circuits (Microcircuits) Manufacturing, General Specification for |
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