SEMI E130 : 2017
Current
Current
The latest, up-to-date edition.
SPECIFICATION FOR PROBER SPECIFIC EQUIPMENT MODEL FOR 300 MM ENVIRONMENT (PSEM300)
Published date
12-01-2013
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Sets up a Prober Specific Equipment Model for prober equipment deployed in a factory adhering to the Global Joint Guidance for 300 mm Standards (PSEM300).
DevelopmentNote |
Not available for sale from ILI, customer to contact SEMI. Includes SEMI E130.1. (10/2003)
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DocumentType |
Standard
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PublisherName |
Semiconductor Equipment & Materials Institute
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Status |
Current
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SupersededBy |
SEMI E130.1 : 2004(R2010) | SPECIFICATION FOR PROBER SPECIFIC EQUIPMENT MODEL FOR 300 MM ENVIRONMENT (PSEM300) |
SEMI T13 : 2004(R2010) | SPECIFICATION FOR DEVICE TRACKING: CONCEPTS, BEHAVIOR AND SERVICES |
SEMI E94 : 2014 | SPECIFICATION FOR CONTROL JOB MANAGEMENTT |
SEMI E42 : 2004 | RECIPE MANAGEMENT STANDARD: CONCEPTS, BEHAVIOR, AND MESSAGE SERVICES |
SEMI M20 : 2015 | PRACTICE FOR ESTABLISHING A WAFER COORDINATE SYSTEM |
SEMI G81 : 2007(R2015) | SPECIFICATION FOR MAP DATA ITEMS |
SEMI E40 : 2013 | STANDARD FOR PROCESSING MANAGEMENT |
SEMI E90 : 2012(R2018) | SPECIFICATION FOR SUBSTRATE TRACKING |
SEMI G85 : JUL 2003 | SPECIFICATION FOR MAP DATA FORMAT |
SEMI E87 : 2017 | SPECIFICATION FOR CARRIER MANAGEMENT (CMS) |
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