SN EN 60749-32 : 2003
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 32: FLAMMABILITY OF PLASTIC-ENCAPSULATED DEVICES (EXTERNALLY INDUCED)
12-01-2013
Foreword<br>INTRODUCTION<br>1 Scope and object<br>2 Normative references<br>3 Test procedure<br>Annex ZA (normative) Normative references to international<br> publications with their corresponding European<br> publications
Applies to semiconductor devices (discrete devices and integrated circuits). It determines whether the device ignites due to external heating.
| DocumentType |
Standard
|
| PublisherName |
Swiss Standards
|
| Status |
Current
|
| Standards | Relationship |
| IEC 60749-32:2002+AMD1:2010 CSV | Identical |
| DIN EN 60749-32:2011-01 | Identical |
| I.S. EN 60749-32:2003 | Identical |
| UNE-EN 60749-32:2004 | Identical |
| EN 60749-32:2003/A1:2010 | Identical |
| NF EN 60749-32 : 2003 AMD 1 2011 | Identical |
| BS EN 60749-32 : 2003 | Identical |
| NBN EN 60749-32 : 2004 AMD 1 2010 | Identical |
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