SN EN 60749-36 : 2003
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 36: ACCELERATION, STEADY STATE
12-01-2013
Foreword
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices.
| DocumentType |
Standard
|
| PublisherName |
Swiss Standards
|
| Status |
Current
|
| Standards | Relationship |
| DIN EN 60749-36:2003-12 | Identical |
| EN 60749-36:2003 | Identical |
| IEC 60749-36:2003 | Identical |
| I.S. EN 60749-36:2003 | Identical |
| UNE-EN 60749-36:2004 | Identical |
| BS EN 60749-36:2003 | Identical |
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