TIA 455-127 : A2006(R2014)
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FOTP-127-A - BASIC SPECTRAL CHARACTERIZATION OF LASER DIODES
Published date
12-01-2013
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The intent of this test procedure is to measure the central wavelength, peak wavelength, and the spectral width (rms, MSTM, 15 dB down and FWHM) of a Multilongitudinal Mode (MLM) semiconductor laser diode using a dispersive spectrophotometric (using a revolving diffraction grating) method or other suitable methods.
| Committee |
FO-4.0
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| DocumentType |
Standard
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| PublisherName |
Telecommunications Industry Association
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| Status |
Current
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