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TIA 455-127 : A2006(R2014)

Current

Current

The latest, up-to-date edition.

FOTP-127-A - BASIC SPECTRAL CHARACTERIZATION OF LASER DIODES

Published date

12-01-2013

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The intent of this test procedure is to measure the central wavelength, peak wavelength, and the spectral width (rms, MSTM, 15 dB down and FWHM) of a Multilongitudinal Mode (MLM) semiconductor laser diode using a dispersive spectrophotometric (using a revolving diffraction grating) method or other suitable methods.

Committee
FO-4.0
DocumentType
Standard
PublisherName
Telecommunications Industry Association
Status
Current

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