Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge (Endorsed by AENOR in November of 2011.)

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Hardcopy , PDF

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English

Published date

01-11-2011

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Asociación Española de Normalización

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Committee	CTN 209/SC 47
DocumentType	Standard
Pages	26
PublisherName	Asociación Española de Normalización
Status	Current

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UNE-EN 60749-40:2011