• Shopping Cart
    There are no items in your cart

VITA 51.2 : 2016

Current

Current

The latest, up-to-date edition.

PHYSICS OF FAILURE RELIABILITY PREDICTIONS

Published date

12-01-2013

Sorry this product is not available in your region.

Gives standard processes, instructions and default parameters for using the Physics of Failure (PoF) approach for modeling the reliability of electronic products.

DocumentType
Standard
PublisherName
Vmebus Int. Trade Association
Status
Current

MIL STD 11991 : A GENERAL STANDARD FOR PARTS, MATERIALS, AND PROCESSES
15/30310531 DC : 0 BS EN 61709 ED 3.0 - ELECTRIC COMPONENTS - RELIABILITY - REFERENCE CONDITIONS FOR FAILURE RATES AND STRESS MODELS FOR CONVERSION
I.S. EN 61709:2017 ELECTRIC COMPONENTS - RELIABILITY - REFERENCE CONDITIONS FOR FAILURE RATES AND STRESS MODELS FOR CONVERSION
IEC 61709:2017 RLV Electric components - Reliability - Reference conditions for failure rates and stress models for conversion
EN 61709:2017 Electric components - Reliability - Reference conditions for failure rates and stress models for conversion
EIA STD 4899 : 2017-05 REQUIREMENTS FOR AN ELECTRONIC COMPONENTS MANAGEMENT PLAN
EIA 933 : 2015 REQUIREMENTS FOR A COTS ASSEMBLY MANAGEMENT PLAN
IEEE 1205-2014 IEEE Guide for Assessing, Monitoring, and Mitigating Aging Effects on Electrical Equipment Used in Nuclear Power Generating Stations and Other Nuclear Facilities
BS EN 61709:2017 Electric components. Reliability. Reference conditions for failure rates and stress models for conversion
SAE ARP6338 Process for Assessment and Mitigation of Early Wearout of Life-limited Microcircuits
IEC 61709:2017 Electric components - Reliability - Reference conditions for failure rates and stress models for conversion

Access your standards online with a subscription

Features

  • Simple online access to standards, technical information and regulations.

  • Critical updates of standards and customisable alerts and notifications.

  • Multi-user online standards collection: secure, flexible and cost effective.