Comment Closes On
|
|
Committee
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EPL/47 |
Document Type
|
Draft |
ISBN
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|
Pages
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Published
|
|
Publisher
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British Standards Institution
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Status
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Superseded |
Superseded By
|
|
IEC 61967-1:2002
|
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions |
IEC TS 61967-3:2014
|
Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method |
IEC 62014-1:2001
|
Electronic design automation libraries - Part 1: Input/output buffer information specifications (IBIS version 3.2) |
IEC TS 62404:2007
|
Logic digital integrated circuits - Specification for I/O interface model for integrated circuit (IMIC version 1.3) |
IEC 61967-5:2003
|
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions - Workbench Faraday Cage method |
IEC 61967-4:2002+AMD1:2006 CSV
|
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method |
IEC 61947-2:2001
|
Electronic projection - Measurement and documentation of key performance criteria - Part 2: Variable resolution projectors |
IEC 61967-6:2002+AMD1:2008 CSV
|
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method |
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