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    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

    BS EN 60747-16-5 - SEMICONDUCTOR DEVICES - PART 16-5: MICROWAVE INTEGRATED CIRCUITS - OSCILLATORS

    Available format(s):  Hardcopy, PDF

    Superseded date:  30-09-2013

    Language(s):  English

    Published date: 

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    1 Scope
    2 Normative references
    3 Terms and definitions
    4 Essential ratings and characteristics
      4.1 General
      4.2 Application description
      4.3 Specification of the function
      4.4 Limiting values (absolute maximum rating system)
      4.5 Operating conditions (within the specified operating
           temperature range)
      4.6 Electrical characteristics
      4.7 Mechanical and environmental ratings, characteristics
           and data
      4.8 Additional information
    5 Measuring methods
      5.1 General
      5.2 Oscillation frequency (f[osc])
      5.3 Output power (P[o,osc])
      5.4 Phase Noise (N[phase])
      5.5 Tuning sensitivity (S[f,v])
      5.6 Frequency pushing (f[osc,push])
      5.7 Frequency pulling (f[osc,pull])
      5.8 nth order harmonic distortion ratio (P[1]/P[nth])
      5.9 Output power flatness (DeltaP[o,osc])
      5.10 Tuning linearity
      5.11 Frequency temperature coefficient (alpha[f,temp])
      5.12 Output power temperature coefficient (alpha[P,temp])
      5.13 Spurious distortion ratio (P[1]/P[s])
      5.14 3dB modulation frequency band (B[mod,3dB])
      5.15 Sensitivity flatness
    6 Verifying methods
      6.1 Load mismatch tolerance (Psi[L])
      6.2 Load mismatch ruggedness (Psi[R])

    General Product Information - (Show below) - (Hide below)

    Comment Closes On
    Committee EPL/47
    Document Type Draft
    Publisher British Standards Institution
    Status Superseded
    Superseded By

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60747-4:2007+AMD1:2017 CSV Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors
    IEC 61340-5-1:2016 Electrostatics - Part 5-1: Protection of electronic devices from electrostatic phenomena - General requirements
    IEC TR 61340-5-2:2007 Electrostatics - Part 5-2: Protection of electronic devices from electrostatic phenomena - User guide
    IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
    IEC 60748-2:1997 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
    IEC 60748-3:1986 Semiconductor devices - Integrated circuits - Part 3: Analogue integrated circuits
    IEC 60748-4:1997 Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits
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