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  • BS CECC 63000:1990

    Current The latest, up-to-date edition.

    Harmonized system of quality assessment for electronic components. Generic specification: film and hybrid integrated circuits

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  31-12-1990

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    Foreword
    Preface
    Section 1 - Scope
    Section 2 - General
    2.1 Order of precedence
    2.2 Related documents
    2.3 Units, symbols and terminology
    2.4 Standard and preferred values
    2.5 Marking
    Section 3 - Quality assessment procedures
    3.1 Primary stage of manufacture
    3.2 Manufacturing stages and sub-contracting
    3.3 Manufacturer's approval
    3.4 Approval of Film and Hybrid Integrated Circuits
           (F&HICs)
    3.5 Qualification approval
    3.6 Capability approval
    3.7 Certified test records
    3.8 Delayed deliveries
    3.9 Delivery of F&HICs subjected to destructive or
           non destructive tests
    3.10 Supplementary procedure for deliveries
    3.11 Supplementary information
    Section 4 - Test and measurement procedures
    4.1 General
    4.2 Standard conditions for testing
    4.3 Visual examination
    4.4 Electrical measurement procedures
    4.5 Environmental testing procedures
    4.6 Screening
    Annex A - Internal visual examination

    Abstract - (Show below) - (Hide below)

    Defines procedures and methods for testing and states requirements for the release of products using either qualification approval or capability approval procedures.

    General Product Information - (Show below) - (Hide below)

    Committee EPL/47
    Development Note Inactive for the new design. Supersedes BS CECC63000(1985), 85/30968 DC, 85/30991 DC and 87/23094 DC (01/2006)
    Document Type Standard
    Publisher British Standards Institution
    Status Current

    Standards Referencing This Book - (Show below) - (Hide below)

    CECC 64000 : 1988 GENERIC SPECIFICATION: FILM RESISTOR NETWORKS
    BS 5555:1993 Specification for SI units and recommendations for the use of their multiples and of certain other units
    IEC 60147-1:1972 Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 1: Essential ratings and characteristics
    CECC 00109 : 1974 CECC RULES OF PROCEDURE: RP 9: CERTIFIED TESTS RECORDS
    CECC 00107(PT3) : 80 AMD 1 CECC RULES OF PROCEDURE: RP7: QUALITY ASSESSMENT PROCEDURES - PROCEDURE FOR CAPABILITY APPROVAL
    IEC 60191-1:2007 Mechanical standardization of semiconductor devices - Part 1: General rules for the preparation of outline drawings of discrete devices
    IEC 60134:1961 Rating systems for electronic tubes and valves and analogous semiconductor devices
    BS 2011-2.1B:1977 Environmental testing. Tests Tests B. Dry Heat
    BS 9000-2(1996) : 1996 GENERAL REQUIREMENTS FOR A SYSTEM FOR ELECTRONIC COMPONENTS OF ASSESSED QUALITY - SPECIFICATION FOR THE NATIONAL IMPLEMENTATION OF THE CECC SYSTEM
    BS E9007:1975 Specification for harmonized system of quality assessment for electronic components: Basic specification: Sampling plans and procedures for inspection by attributes
    CECC 00100 : 1988 BASIC RULES - TO BE USED IN CONNECTION WITH THE INTERNAL REGULATIONS OF THE FEN e.V
    BS 2011-2.1XA(1981) : 1981 AMD 7553 ENVIRONMENTAL TESTING - TESTS - TEST XA AND GUIDANCE - IMMERSION IN CLEANING SOLVENTS
    IEC 60027-1:1992 Letters symbols to be used in electrical technology - Part 1: General
    BS 2011-2.1N:1985 Environmental testing. Tests Test N. Change of temperature
    BS 2011-2.1Ca:1977 Environmental testing. Tests Test Ca. Damp heat, steady state
    CECC 00110 : 1994 RULE OF PROCEDURE 10 - NATIONAL IMPLEMENTATION OF CECC PRODUCED EUROPEAN STANDARDS AND SPECIFICATIONS
    IEC 60410:1973 Sampling plans and procedures for inspection by attributes
    BS 4727(1971) : LATEST
    CECC 00107(PT2) : 79 AMD 1 CECC RULES OF PROCEDURE: RP7: QUALITY ASSESSMENT PROCEDURES - PROCEDURE FOR ENHANCED ASSESSMENT OF QUALITY
    IEC 60147-0B:1969 Supplement B - Essential ratings and characteristics et semiconductor devices and general principles of measuring methods - Part 0: General and terminology
    CECC 00107(PT1) : 1982 CECC RULES OF PROCEDURE: RP7: QUALITY ASSESSMENT PROCEDURES - QUALITY ASSESSMENT PROCEDURE FOR GENERAL USAGE
    IEC TR 60440:1973 Method of measurement of non-linearity in resistors
    CECC 00111 : 80 AMD 3 CECC RULES OF PROCEDURE: RP 11: SPECIFICATIONS AND THEIR HARMONIZATION - COMPONENTS FOR GENERAL AND PROFESSIONAL USAGE - COMPONENTS OF ENHANCED ASSESSMENT OF QUALITY
    BS 2011-2.1Ka:1982 Environmental testing. Tests Test Ka.Salt mist
    IEC 60147-0:1966 Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 0: General and terminology
    IEC 60148A:1974 First supplement - Letter symbols for semiconductor devices and integrated microcircuits
    BS 3934:1965 Specification for dimensions of semiconductor devices and integrated electronic circuits
    IEC 60148:1969 Letter symbols for semiconductor devices and integrated microcircuits
    IEC 60147-0D:1974 Supplement D - Essential ratings and characteristics et semiconductor devices and general principles of measuring methods -Part 0: General and terminology
    CECC 00108 : 94 AC 98 RULE OF PROCEDURE 8 (ATTESTATION OF CONFORMITY) - PART 1: THE CECC MARK AND CONDITIONS OF USE - PART 2: CERTIFICATES OF APPROVAL - PART 3: PROCEDURES FOR THE ATTESTATION OF CONFORMITY
    BS 2011-3A & B:1977 Environmental testing. Background information Tests A (cold) and tests B (dry heat)
    IEC 60191-3:1999 Mechanical standardization of semiconductor devices - Part 3: General rules for the preparation of outline drawings of integrated circuits
    BS 2011-2.1T:1981 Environmental testing. Tests Test T. Soldering
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