BS EN 60444-6:2013
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Measurement of quartz crystal unit parameters Measurement of drive level dependence (DLD)
Hardcopy , PDF
05-11-2021
English
31-10-2013
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INTRODUCTION
1 Scope
2 Normative references
3 DLD effects
4 Drive levels for DLD measurement
5 Test methods
Annex A (normative) - Relationship between electrical
drive level and mechanical displacement of
quartz crystal units
Annex B (normative) - Method C: DLD measurement
with oscillation circuit
Bibliography
Annex ZA (normative) - Normative references to
international publications with their
corresponding European publications
Pertains to the measurements of drive level dependence (DLD) of quartz crystal units.
| Committee |
W/-
|
| DevelopmentNote |
Renumbers and supersedes BS 7681-6(1995) 1997 version incorporates amendment 9662 to BS 7681-6(1995) Supersedes 93/201330 DC (11/2005) Supersedes 08/30191241 DC. (10/2013)
|
| DocumentType |
Standard
|
| Pages |
24
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
IEC 60444-6:2013 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods and one referential method are described. This edition includes the following significant technical changes with respect to the previous edition:
a) DLD measurement with oscillation circuit had the traditional method to detect the DLD abnormal modes at present time. Therefore, this method made the transition to the Annex B.
b) High reliability crystal unit is needed to use for various applications at the present day, in order to upgrade the inspection capabilities for DLD abnormal modes, the multi-level reference measurement method was introduced into this specification.
| Standards | Relationship |
| SN EN 60444-6 : 1997 | Identical |
| NF EN 60444-6 : 2014 | Identical |
| DIN EN 60444-6:2014-02 | Identical |
| NBN EN 60444-6 : 2013 | Identical |
| I.S. EN 60444-6:2013 | Identical |
| EN 60444-6:2013 | Identical |
| IEC 60444-6:2013 | Identical |
| IEC 60444-8:2016 | Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units |
| IEC 60444-5:1995 | Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction |
| EN 60444-8:2017 | Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units |
| EN 60444-1:1997/A1:1999 | MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS BY ZERO PHASE TECHNIQUE IN A PI-NETWORK - PART 1: BASIC METHOD FOR THE MEASUREMENT OF RESONANCE FREQUENCY AND RESONANCE RESISTANCE OF QUARTZ CRYSTAL UNITS BY ZERO PHASE TECHNIQUE IN A PI-NETWORK |
| EN 60444-5:1997 | Measurement of quartz crystal unit parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction |
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