BS EN 60512-6-2:2002
Current
The latest, up-to-date edition.
Connectors for electronic equipment. Tests and measurements. Dynamic stress tests Test 6b. Bump
Hardcopy , PDF
English
05-06-2002
Foreword
1 General
2 Preparation of the specimen
3 Test method
4 Measurements
5 Details to be specified
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Assess the ability of components to withstand specified severities of bump.
Committee |
EPL/48
|
DevelopmentNote |
Supersedes 00/203601 DC (06/2002)
|
DocumentType |
Standard
|
Pages |
10
|
PublisherName |
British Standards Institution
|
Status |
Current
|
Supersedes |
Defines a standard test method to assess the ability of components (essentially connectors) to withstand specified severities of bump.
Standards | Relationship |
EN 60512-6-2:2002 | Identical |
I.S. EN 60512-6-2:2002 | Identical |
DIN EN 60512-6-2:2003-01 | Identical |
UNE-EN 60512-6-2:2002 | Identical |
IEC 60512-6-2:2002 | Identical |
NF EN 60512-6-2 : 2002 | Identical |
IEC 60512-7:1993 | Electromechanical components for electronic equipment; basic testing procedures and measuring methods - Part 7: Mechanical operating tests and sealing tests |
IEC 60512-2-5:2003 | Connectors for electronic equipment - Tests and measurements - Part 2-5: Electrical continuity and contact resistance tests - Test 2e: Contact disturbance |
EN 60512-1:2001 | Connectors for electronic equipment - Tests and measurements - Part 1: General |
IEC 60512-1-1:2002 | Connectors for electronic equipment - Tests and measurements - Part 1-1: General examination - Test 1a: Visual examination |
IEC 60512-2-1:2002 | Connectors for electronic equipment - Tests and measurements - Part 2-1: Electrical continuity and contact resistance tests - Test 2a: Contact resistance - Millivolt level method |
EN 60068-2-29:1993 | Environmental testing - Part 2: Tests - Test Eb and guidance: Bump |
IEC 60068-2-29:1987 | Environmental testing. Part 2: Tests. Test Eb and guidance: Bump |
EN 60512-2-1:2002 | Connectors for electronic equipment - Tests and measurements - Part 2-1: Electrical continuity and contact resistance tests - Test 2a: Contact resistance - Millivolt level method |
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