BS EN 60749-24:2004
Current
The latest, up-to-date edition.
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST
Hardcopy , PDF
English
24-06-2004
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FOREWORD
1 Scope and object
2 Normative references
3 Test apparatus
4 General requirements
5 Test conditions
6 Procedure
7 Failure criteria
8 Safety
9 Summary
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Specifies temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.
| Committee |
EPL/47
|
| DevelopmentNote |
Supersedes 02/207670 DC. (10/2004)
|
| DocumentType |
Standard
|
| Pages |
10
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
The unbiased highly accelerated stress test is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. It employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.
| Standards | Relationship |
| NF EN 60749-24 : 2005 | Identical |
| EN 60749-24:2004 | Identical |
| IEC 60749-24:2004 | Identical |
| DIN EN 60749-24:2004-09 | Identical |
| NBN EN 60749-24 : 2005 | Identical |
| I.S. EN 60749-24:2004 | Identical |
| UNE-EN 60749-24:2005 | Identical |
| IEC 60749-5:2017 | Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test |
| EN 60749-5:2017 | Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test |
| IEC 60749-33:2004 | Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave |
| EN 60749-33:2004 | Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave |
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