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BS EN 60749-27 : 2006

Current

Current

The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 27: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - MACHINE MODEL (MM)

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2006

€156.59
Excluding VAT

1 Scope
2 Normative references
3 Terms and definitions
4 Equipment
5 MM current waveform requirements
6 Device specific evaluation considerations
7 Classification procedure
8 Failure criteria
9 Classification criteria
10 Summary
Annex ZA (normative) - Normative references to international
         publications with their corresponding European
         publications

Describes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD).

Committee
EPL/47
DevelopmentNote
Supersedes BS EN 60749. (09/2006) Supersedes 05/30128292 DC (10/2006) 2006 Edition Re-Issued in January 2013 & incorporates AMD 1 2012 Supersedes 11/30252690 DC. (02/2013)
DocumentType
Standard
Pages
16
PublisherName
British Standards Institution
Status
Current
Supersedes

EN 61340-3-2:2007 Electrostatics - Part 3-2: Methods for simulation of electrostatic effects - Machine model (MM) electrostatic discharge test waveforms
IEC 60749-26:2013 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
IEC 61340-3-2:2006 Electrostatics - Part 3-2: Methods for simulation of electrostatic effects - Machine model (MM) electrostatic discharge test waveforms
EN 60749-26:2014 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

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