BS EN 60749-32 : 2003
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 32: FLAMMABILITY OF PLASTIC-ENCAPSULATED DEVICES (EXTERNALLY INDUCED)
Hardcopy , PDF
English
01-01-2003
Foreword
INTRODUCTION
1 Scope and object
2 Normative references
3 Test procedure
Annex ZA (normative) - Normative references to international
publications with their corresponding European
publications
Applies to semiconductor devices (discrete devices and integrated circuits). It determines whether the device ignites due to external heating.
| Committee |
EPL/47
|
| DevelopmentNote |
Supersedes BS EN 60749. (09/2005) 2003 Edition Re-Issued in March 2011 & incorporates AMD 1 2010. Supersedes 09/30208094 DC. (03/2011)
|
| DocumentType |
Standard
|
| Pages |
8
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| DIN EN 60749-32:2011-01 | Identical |
| IEC 60749-32:2002+AMD1:2010 CSV | Identical |
| I.S. EN 60749-32:2003 | Identical |
| EN 60749-32:2003/A1:2010 | Identical |
| NF EN 60749-32 : 2003 AMD 1 2011 | Identical |
| NBN EN 60749-32 : 2004 AMD 1 2010 | Identical |
| EN 60749-32:2003 | Equivalent |
| UNE-EN 60749-32:2004 | Identical |
| EN 60695-11-5:2017 | Fire hazard testing - Part 11-5: Test flames - Needle-flame test method - Apparatus, confirmatory test arrangement and guidance |
| IEC 60695-11-5:2016 | Fire hazard testing - Part 11-5: Test flames - Needle-flame test method - Apparatus, confirmatory test arrangement and guidance |
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