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  • BS EN 60749-5:2017

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    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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    Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life test

    Available format(s):  Hardcopy, PDF

    Superseded date:  06-02-2024

    Language(s):  English

    Published date:  20-07-2017

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    1 Scope
    2 Normative references
    3 Terms and definitions
    4 General
    5 Equipment
    6 Test conditions
    7 Procedures
    8 Failure criteria
    9 Safety
    10 Summary
    Annex ZA (normative) - Normative references to international
             publications with their corresponding European
             publications

    Abstract - (Show below) - (Hide below)

    Defines a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.

    Scope - (Show below) - (Hide below)

    This part of IEC60749 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments. This test method is considered destructive.

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    Committee EPL/47
    Development Note Supersedes 00/203277 DC (10/2004) Supersedes BS EN 60749. (09/2005) Supersedes 16/30348576 DC. (07/2017)
    Document Type Standard
    Publisher British Standards Institution
    Status Superseded
    Superseded By
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    EN 60749-4:2017 Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
    IEC 60749-4:2017 Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
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